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測試工程師，你覺得這份量測榜單如何？如果讓你選明年最想玩的3套量測設備，你會選哪幾個？
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”Best in Test”獎項為每年頒發一次，主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域，無論是產品的製造廠商或是使用者，都可以分別就各領域項目，針對上一年度廠商所發表的產品提名。挾著65,000份的發行量，Test & Measurement World在T&M貿易期刊中占有十足的影響力，目前擁有 130,000 讀者，55 % 為管理階級。
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4 C0 s; ]8 `' yTest & Measurement World, 12/1/2006
+ [) Y% f4 s3 _4 y% qhttp://www.reed-electronics.com/tmworld/article/CA6401689.html
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2007 Best in Test Award Winners % }) b; o7 @) s6 R
DIGITAL MULTIMETERS- p& P. o9 G; T% w; V
8846A digital multimeter, Fluke, H' ~: i0 \/ h' S V) ]
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AUDIO TEST
1 m- O! V+ Q! EAPx585 audio tester, Audio Precision* Q" X- C& a6 T
! d/ `) p4 a( }5 c9 G7 R% iWAVEFORM GENERATORS
& \0 g3 }; Y' |- P, l2 `0 XAWG7000 series arbitrary waveform generators, Tektronix
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% c3 t6 z% c$ U2 o- mDATA-ACQUISITION2 V8 x" u3 B& A8 D+ B4 _
CompactDaq USB-based data-acquisition system, National Instruments3 s5 E4 W) L- g. M, a+ l% ^6 c* z
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RF/MICROWAVE TEST7 R. A& j. D$ z3 w$ X9 V) V' v* \
FSUP signal source analyzer, Rohde & Schwarz
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/ Y% | h4 S q: LOSCILLOSCOPES
- d Z g7 B7 D; t" ^4 S5 H: q% NInfiniium 80000B series oscilloscopes, Agilent Technologies
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8 D9 U( e- @2 Q3 B% N8 t6 xMEMS TEST
' |; w: |" c; ?5 O5 i3 G; xInFlip MEMS strip-test module, Multitest
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/ ^% G5 z6 {; r" D0 fPROBING SYSTEMS% l, c4 ~; z8 [& c
M150 Measurement Platform, Cascade Microtech2 ]5 ?) U% C4 S
* P4 n6 k( v. a6 G) D8 E) @3 cAUTOMATED OPTICAL INSPECTION
) `) r$ M' o3 T7 ]7 {5 COptiCon BasicLine 1M/4M AOI system, Goepel electronic) I; g- Z5 I o1 Z7 V5 ]9 x
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WIRELINE COMMUNICATIONS
: E a" K' W! l. h Z% LSpirent Protocol Tester, Spirent Communications3 o' d4 G: j5 V! U( Y0 P0 n
% v8 R' t9 S. j( K; u" pBOARD TEST
. G# I) z1 H5 F6 k. T7 VTapCommunicator boundary-scan interface, JTAG Technologies
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8 X3 F4 m* U/ }2 TSEMICONDUCTOR TEST
/ c/ g7 N# x4 `7 v# N" W/ [- jTest Management Solutions software, OptimalTest
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2007 Best in Test Awards—Honorable Mentions
# {3 q$ @7 l4 P3 A! G: c QWaveRunner 204Xi oscilloscope+ x9 q7 D# F4 B; @' V) C3 n, Q
LeCroy, www.lecroy.com# u" q9 J8 |: \4 Q* n3 ~0 u3 E
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SystemBIST FPGA configuration device
' N4 \" _8 g1 @2 Z G! xIntellitech, www.intellitech.com- q- s. O1 ]$ v( j
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Vanguard Express AMC protocol & link analyzer; k/ o# x! n) v2 b, F2 g4 D3 o6 N
Vmetro, www.vmetro.com8 F* ]6 G" ?; H- k2 E7 E- F
# }0 B/ z$ Y( I- C6 X) sBBWGD 16-channel mixed-signal module for SoC test1 ^* \% M. p: T! o" L, x! u
Advantest, www.advantest.com3 ^7 P( H l! @% {
' J/ g0 ~5 Z1 J% j5 h$ C* wN9020A MXA signal analyzer6 M* q8 M* T8 K) z; }
Agilent Technologies, www.agilent.com
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Signature MS2781B signal analyzer
( [5 s" ?& t3 ~7 u3 UAnritsu, www.us.anritsu.com% Q- D8 L9 F2 j6 S3 ^
4 u3 @; r( _2 N- w. aDPO4000 oscilloscopes with Wave Inspector+ z% b1 y$ e2 _$ o
Tektronix, www.tektronix.com9 P9 w0 x4 J, K- p6 L
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Medalist iVTEP vectorless test software
8 F5 ~; u$ e; K$ i8 a' ]6 dAgilent Technologies, www.agilent.com; r2 R2 T- y. C! f N' R
4 E7 J' b Z2 _. }- z3 z% {V93000 HSM high-speed DRAM tester# d" ]! H' h/ D9 C9 v
Verigy, www.verigy.com/ d/ ? [1 P2 F0 d8 ?& h$ u
% T% e& c2 z6 T: G" _* D* c7 OSiloti SilVE visibility enhancement tool
+ y* ?: Y2 n' W2 E& c, s# v4 qNovas Software, www.novas.com
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' k' c$ U; ?8 a7 z j. ]E2960B Series protocol analyzer/exerciser for PCIe2
4 p! C* D r6 u# ?" Z5 xAgilent Technologies, www.agilent.com
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F$ I) X# ?+ B* ?9 V6 x0 zR&S ESU EMI test receivers2 j4 q( v: |) ^1 E2 v
Rohde & Schwarz, www.rohde-schwarz.com
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0 c3 \% O8 F/ c) J. B% ]- O! O7 `Model 2910/2810 vector signal generator/analyzer
9 r. r5 }9 l+ D0 Q, jKeithley Instruments, www.keithley.com |
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