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測試工程師,你覺得這份量測榜單如何?如果讓你選明年最想玩的3套量測設備,你會選哪幾個?! D9 \. U- e# ~8 e, V3 |4 q, ^
7 R k, Y* Q) f% S”Best in Test”獎項為每年頒發一次,主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域,無論是產品的製造廠商或是使用者,都可以分別就各領域項目,針對上一年度廠商所發表的產品提名。挾著65,000份的發行量,Test & Measurement World在T&M貿易期刊中占有十足的影響力,目前擁有 130,000 讀者,55 % 為管理階級。
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Test & Measurement World, 12/1/2006+ q5 q- \" @# b1 \8 G5 s
http://www.reed-electronics.com/tmworld/article/CA6401689.html0 J( o' ]( `! H8 A" d5 ~
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2007 Best in Test Award Winners % h o; z# J. R. o* R& l& t
DIGITAL MULTIMETERS9 t$ w8 q( b; o
8846A digital multimeter, Fluke
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- a- f# x) h3 f) ]* a2 `8 \AUDIO TEST
$ s2 Z& `. s& r8 wAPx585 audio tester, Audio Precision# I# u- A* Z4 o! f
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WAVEFORM GENERATORS/ q/ L% y/ ^0 Y! b r% r
AWG7000 series arbitrary waveform generators, Tektronix+ A" Q2 I A7 \& C+ |8 w7 O; G0 q2 V
# |1 x* {* p h. |- c2 M! hDATA-ACQUISITION
: w/ u/ B' p1 S& X" OCompactDaq USB-based data-acquisition system, National Instruments: v" |; t8 y0 E' @, ?
% T2 W- d( y" n# |" I$ D1 PRF/MICROWAVE TEST8 d; ^* k& n# s
FSUP signal source analyzer, Rohde & Schwarz# t D# F' `5 B& h' G3 @
6 m6 q0 d. }+ d% d4 \0 }1 GOSCILLOSCOPES
1 c, J8 n' W9 M. i- t, c: ]Infiniium 80000B series oscilloscopes, Agilent Technologies# _2 f. {7 a9 ] c7 A4 L. l' X' G
/ o6 v6 G, R4 O1 h* zMEMS TEST
* n; n/ s; W! b5 d2 mInFlip MEMS strip-test module, Multitest; i t* B- b7 ]- ~! h
$ ^* a. K4 {& o5 _PROBING SYSTEMS
( }' \! I k! `+ cM150 Measurement Platform, Cascade Microtech
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AUTOMATED OPTICAL INSPECTION
. e7 _ q1 [2 K9 o8 kOptiCon BasicLine 1M/4M AOI system, Goepel electronic# F; Q5 }( G# O" j) o7 a
- P" a4 p" Y* i8 SWIRELINE COMMUNICATIONS
: {6 Z0 M9 @8 e3 FSpirent Protocol Tester, Spirent Communications- T0 c: t, m; B) G) X4 n/ z( h
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BOARD TEST0 c* O9 N; W7 X5 n( T
TapCommunicator boundary-scan interface, JTAG Technologies9 V3 q# o0 _0 A: A
7 ^, j, q$ ]6 E& Y7 M% R$ b3 `( v# BSEMICONDUCTOR TEST
5 u. N/ \% ~. b+ B; p- BTest Management Solutions software, OptimalTest5 h+ {8 y$ P" P% Z2 k! W
* [8 M5 o9 a7 D0 `3 `; P2007 Best in Test Awards—Honorable Mentions
) h1 T' \" G' ^9 s" }2 B; uWaveRunner 204Xi oscilloscope
( p- |9 B0 E! w7 ^- VLeCroy, www.lecroy.com( Y7 t5 D9 S! D
, H$ i' W8 ?2 p: G2 }SystemBIST FPGA configuration device
J# L3 ^. T8 _" ~# H4 rIntellitech, www.intellitech.com
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Vanguard Express AMC protocol & link analyzer
8 z/ T4 Z. n% Q6 xVmetro, www.vmetro.com r, m0 h/ C) h
! u. u1 o1 W$ P. cBBWGD 16-channel mixed-signal module for SoC test
+ @9 @1 _5 V b, x2 lAdvantest, www.advantest.com
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N9020A MXA signal analyzer: g' b+ t- m6 B& m& B
Agilent Technologies, www.agilent.com: }. A( c5 a% ~" b/ o W" f
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Signature MS2781B signal analyzer
; m6 M) f/ E) }8 M% [1 YAnritsu, www.us.anritsu.com
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DPO4000 oscilloscopes with Wave Inspector
2 d! z& {/ z# G& |/ |# XTektronix, www.tektronix.com
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Medalist iVTEP vectorless test software
0 L/ G; w, v: g4 i& IAgilent Technologies, www.agilent.com
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V93000 HSM high-speed DRAM tester M( s' ^( s9 d$ L3 W: a
Verigy, www.verigy.com
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Siloti SilVE visibility enhancement tool
/ R# _" Q# o$ T/ \) FNovas Software, www.novas.com
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6 S2 G" y% q! LE2960B Series protocol analyzer/exerciser for PCIe2/ H, b! D7 M1 }9 O- {
Agilent Technologies, www.agilent.com
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R&S ESU EMI test receivers
d: _# g4 i% I. N4 [3 b8 o' oRohde & Schwarz, www.rohde-schwarz.com
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- X. X. Z! |4 u8 y) _Model 2910/2810 vector signal generator/analyzer' Q- @6 A0 w7 `! A' j2 x
Keithley Instruments, www.keithley.com |
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