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發表於 2008-11-26 21:59:05
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IV. CONCLUSION
5 E8 d0 b* K+ B4 y* A( h+ B0 KThe designs with 3-stage-inverter and 1-stage-inverter
6 `' b X, p4 ^, b+ bcontrolling circuits have been studied to verify the optimal$ a2 U2 S, C1 K2 K( x% m
design schemes in NMOS-based power-rail ESD clamp% `! m3 L9 t( S; j' D
circuits. In addition, two ESD clamp NMOS transistors,
' q+ D# n" ^, l' p7 g) P# }9 phaving snapback and no snapback operations, also were codesigned# \3 q# E' n, {' H- C4 ^* ~9 N, U
with different controlling circuits to realize the
) x* C6 x$ `* Y8 X1 G: limpact on their required performance. According to the
3 Q; c/ [3 U* u! Zexperiments and analyses, the 3-stage inverters can slightly
7 v9 N, r% @) A j" f0 ?( Eincrease the ESD robustness, but they also can dramatically
3 m l# c5 d5 [1 I( \sacrifice the mis-trigger and latch-on immunity. The 1-stage
2 l6 g, ]9 |8 e. b% c3 Binverter should be an appropriate and reliable candidate for the& |# r/ [9 P# B
power-rail ESD clamp circuits. |
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