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發表於 2008-11-26 21:59:05
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IV. CONCLUSION
/ K, C2 N7 N* a0 [6 yThe designs with 3-stage-inverter and 1-stage-inverter
) V* N8 c2 x' }. Q/ t* Mcontrolling circuits have been studied to verify the optimal9 s( W# @1 B6 o% v
design schemes in NMOS-based power-rail ESD clamp4 k" r. Z2 z8 B
circuits. In addition, two ESD clamp NMOS transistors,
& V. K5 K5 L- G5 ?: Y. }$ Ehaving snapback and no snapback operations, also were codesigned8 @9 T& z$ Z4 Q7 ~+ ~
with different controlling circuits to realize the" s9 A+ C4 H1 I/ q# D
impact on their required performance. According to the D" v! ]1 S' `3 ]2 i
experiments and analyses, the 3-stage inverters can slightly2 Z! D* s* D' x; k% n& z' Q/ b
increase the ESD robustness, but they also can dramatically( E# k) c* D, S( A
sacrifice the mis-trigger and latch-on immunity. The 1-stage
* P+ u. Z0 Y+ p3 b" C5 G3 U$ K* F" Cinverter should be an appropriate and reliable candidate for the
0 H& @' \7 m( Y: O* r9 tpower-rail ESD clamp circuits. |
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