ESD的另一种情况：CDE（Cable Discharge Event）

semico_ljj

ESD的另一种情况：CDE
CDE--Cable Discharge Event
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+ a8 j& W) M) h4 S$ d2 w3 ]; g, }Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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semico_ljj

Abstract—Cable discharge events (CDEs) have been found
6 s  I$ ~1 V) J3 M  O to be the major root cause of inducing hardware damage on
+ W- U5 \+ `" v* r+ z8 L Ethernet ICs of communication interfaces in real applications. Still,
8 h. W7 \6 o  W! S3 x. Z there is no device-level evaluation method to investigate the ro
1 F6 Y. T! H) G bustness of complementary metal–oxide–semiconductor (CMOS)
devices against a CDE for a layout optimization in silicon chips.

semico_ljj

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hansonzhao

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