|
2#

樓主 |
發表於 2008-11-6 20:40:28
|
只看該作者
Abstract—Cable discharge events (CDEs) have been found+ |2 q- D) k$ }/ i0 g- k
to be the major root cause of inducing hardware damage on$ G, l" } m* S) ]4 ?
Ethernet ICs of communication interfaces in real applications. Still,
/ [- A# n" K, ?' F there is no device-level evaluation method to investigate the ro
5 z+ H4 k& g& b( T1 a bustness of complementary metal–oxide–semiconductor (CMOS), O( u' [0 _3 c' ^4 g
devices against a CDE for a layout optimization in silicon chips. |
|