|
會根據不同的廠家的晶片而有所變動。以下為範例:
( d5 p# l2 {9 |! ^, X0 S* N8 O
% [, b# y6 H1 k" M, D9 j6 E& CExample Test Sequence for Power Calibration# e" |' u V4 }4 z2 [5 _! Y
: b0 h- X* @# S7 f4 x( C
- EEPROM Download
- Transmitter Calibration and Check
- Tx Power Calibration / Adjustment
- Tx Power Check – High, Mid, Low
- Receiver Calibration and Check
- Rx/RSSI Calibration/Adjustment
- Rx/RSSI Check – High, Mid, Low
- Calibration Data Download
) z V* H' i+ J2 Q0 Z% q
Example Test Sequence for Design Verification
5 |+ ^. \3 ^% u0 WTransmitter Test8 ?# \) Z, u1 a" O) g
- Maximum Output Power
- Spurious Emission Mask (Out of Band)
- Phase Noise
- Adjacent Channel Leakage Ratio
Receiver Test5 \- L- n z; i
- Maximum Input Level BLER/BER
- Sensitivity BLER/BER
- DC Power Consumption Test (Optional)
|
|