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Contents
1 Y, o7 e4 e3 O7 H' ?List of Tables
9 k8 w5 S, I8 z7 n1 OList of Figures
3 J5 c7 B Q+ {7 A) P- t5 \/ qSymbols and Abbreviations; T! I; ~: Z' ^7 z7 [2 g8 m
Physical
' ~; k; A6 e" }2 v1 Introduction 1
! z1 ] _; |& X0 {( f1.1 Motivation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
. c8 B4 S1 ], }1.2 Outline of the Work . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 q# E8 M3 a4 T+ \. [+ H( T
2 ADCs in Nanometer CMOS Technologies 3% K+ f# E* R$ u5 j+ x; z8 O
2.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
# E: \: ~- P) k, C+ ^3 X2.2 Scaling-Down of CMOS Technologies . . . . . . . . . . . . . . . . . 3$ |" m6 u5 ~! I" N2 h! K0 {# E
2.2.1 Driving Force of the CMOS Scaling-Down . . . . . . . . . . 4
1 t% M+ _2 P# d- H! D" J: E' \2.2.2 Moving into Nanometer CMOS Technologies . . . . . . . . . 5
; H- P& p/ l+ U( F$ q. k5 `+ l# s# C2.3 Impact of Moving into Nanometer CMOS to Analog Circuits . . . . . 6
) E) c6 e- x3 _6 N5 A5 |2.3.1 Decreased Supply Voltage . . . . . . . . . . . . . . . . . . . 64 Q' m# F4 e8 m# q1 w2 `
2.3.2 Impact on Transistor Intrinsic Gain . . . . . . . . . . . . . . 7
2 g8 n, G; v J' g5 i# l2.3.3 Impact on Device Matching . . . . . . . . . . . . . . . . . . 9, x4 V( u0 b+ E; O% v8 f
2.3.4 Impact on Device Noise . . . . . . . . . . . . . . . . . . . . 10
6 d$ G$ W2 ^0 [" L; c% ~! F4 `2.4 ADCs in Nanometer CMOS . . . . . . . . . . . . . . . . . . . . . . 11
: O' B' J E; U D* ~8 J2.4.1 Decreased Signal Swing . . . . . . . . . . . . . . . . . . . . 13
# ^; f& a/ `( Z/ {2.4.2 Degraded Transistor Characteristics . . . . . . . . . . . . . . 137 N) R. @8 R! n& i8 _
2.4.3 Distortion . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
- @' Z' Z; U% ovii
Z6 a( S, N" N+ t1 u4 v2.4.4 Switch Driving . . . . . . . . . . . . . . . . . . . . . . . . . 14
# t; [5 ]- u V3 V" \1 c0 n& Y2.4.5 Improved Device Matching . . . . . . . . . . . . . . . . . . . 17
, r6 q( B) h. e0 v; Pxi: j7 I3 H' {8 B' m. q
xiii* C/ H4 O1 o- h+ @! D
xxi5 b0 X: t7 g9 x1 E
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xxi
' Q: [ g$ s4 D$ S! h, _& @ `Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xxi2 l. u% l2 [8 G. J0 a ~8 J2 S
CONTENTS, h9 ~1 @; V4 O6 E
2.4.6 Digital Circuits Advantages . . . . . . . . . . . . . . . . . . 177 f" U$ G" r) J" _- M
2.5 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 L. w8 M) }$ v" }; \8 j
3 Principle of - ADC 19" t% s: I) S- U/ v5 Y
3.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
8 _) [5 q6 Q% @; H3 U" C8 R9 {2 I" F3.2 Basic Analog to Digital Conversion . . . . . . . . . . . . . . . . . . 19
# o# x% Q4 M; _# V' v1 D" |2 L3.3 Oversampling and Noise Shaping . . . . . . . . . . . . . . . . . . . 243 g. [8 F8 t2 h7 H' T+ W( Z
3.3.1 Oversampling . . . . . . . . . . . . . . . . . . . . . . . . . . 25
; h, T0 |& w$ Z% Q* {8 `- Y3.3.2 Noise Shaping . . . . . . . . . . . . . . . . . . . . . . . . . 26
6 q: k+ |+ n% Z; _, q3.3.3 - Modulator . . . . . . . . . . . . . . . . . . . . . . . . 29
6 X2 R3 i) l4 A( c3.3.4 Performance Metrics for the - ADC . . . . . . . . . . . . 31
{) N. x/ X4 B+ U5 N$ `3.4 Traditional - ADC Topology . . . . . . . . . . . . . . . . . . . . 33( i1 {* @$ O* j6 `" {, O% ]
3.4.1 Single-Loop Single-Bit - Modulators . . . . . . . . . . . 334 \* w( K: W' f- e/ [
3.4.2 Single-Loop Multibit - Modulators . . . . . . . . . . . . 37
/ a2 ~! h7 j. g/ n. J" t1 }$ {3.4.3 Cascaded - Modulators . . . . . . . . . . . . . . . . . . 39+ Q8 O# l1 h2 i, x5 O/ j$ @
3.4.4 Performance Comparison of Traditional - Topologies . . 46+ @4 M* ~9 F/ u; F8 g# ^
3.5 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
2 `. }8 H' i, x4 Low-Power Low-Voltage - ADC Design in Nanometer CMOS: Circuit, H/ _+ ~0 B5 C" l4 E
Level Approach 47
* i# c) r1 V* ^ O( f1 J) q0 \& @4.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47" Z) f2 j) E1 j5 N1 o
4.2 Low-Voltage Low-Power OTA Design . . . . . . . . . . . . . . . . . 481 O4 C) {. _+ ]; }. Y; `+ Z5 ~
4.2.1 Gain Enhanced Current Mirror OTA Design . . . . . . . . . . 49" ~) c: m7 T4 I$ U
4.2.2 A Test Gain-Enhanced Current Mirror OTA . . . . . . . . . . 53
$ R; `* q. o$ A. S' T5 o5 w: C; q/ ^2 h6 f4.2.3 Implementation and Measurement Results . . . . . . . . . . . 54
5 a; Y3 b: E w5 G A- ^( X4.2.4 Two-Stage OTA Design . . . . . . . . . . . . . . . . . . . . 55
' ~$ Z3 V$ ~2 v) X! o4.3 Low-Voltage Low-Power - ADC Design . . . . . . . . . . . . . . 66
5 q" r+ s; d: X* u4 u4.3.1 Impact of Circuit Nonidealities to - ADC Performance . . 66
! ]* f+ [, M0 N- p# S" G Z4.3.2 Modulator Topology Selection . . . . . . . . . . . . . . . . . 67. D9 l) j* l: j7 q) z2 ~4 [, y
4.3.3 OTA Topology Selection . . . . . . . . . . . . . . . . . . . . 69. {, [: s& Y9 k
4.3.4 Transistor Biasing . . . . . . . . . . . . . . . . . . . . . . . 75
C! N% X+ T) m: v4.3.5 Scaling of Integrators . . . . . . . . . . . . . . . . . . . . . . 753 R7 q1 i2 l$ ~1 G
4.4 A 1-V 140-μW- Modulator in 90-nm CMOS . . . . . . . . . . . 76
6 A, W6 ?& e9 ~5 W: @6 m6 s d s4.4.1 Building Block Circuits Design . . . . . . . . . . . . . . . . 76* F$ H" O( `4 ^, W! ^% ^
viii
, E, K3 g: ? o8 O4.4.2 Implementation . . . . . . . . . . . . . . . . . . . . . . . . . 80
) v3 K0 p- y; s& J. B3 c: f4.4.3 Measurement Results . . . . . . . . . . . . . . . . . . . . . . 82* c l7 s' C$ C! I/ q* j# v
4.5 Measurements on PSRR and Low-Frequency Noise Floor . . . . . . . 87
5 J/ w* R( y8 }: f8 e+ S5 f4.5.1 Introduction of PSRR . . . . . . . . . . . . . . . . . . . . . . 87
* W8 i. w7 b7 u2 O1 j4.5.2 PSRR Measurement Setup . . . . . . . . . . . . . . . . . . . 887 u4 m; i6 @& b$ ~2 J
4.5.3 PSRR Measurement Results . . . . . . . . . . . . . . . . . . 88- |$ _7 }8 \3 ~
4.5.4 Measurement on Low-Frequency Noise Floor . . . . . . . . . 95& P4 z- u$ H% C( j. a
4.6 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
. P0 ^7 N5 ~$ I' T: W! I5 Low-Power Low-Voltage - ADC Design in Nanometer CMOS: System
$ z& l8 q" S& U7 Y. rCONTENTS ix
4 E, h0 V. i* w5 d) lCONTENTS9 S1 A0 a* U$ J6 ?. h
6 Conclusions 149
, o8 k; \( `, F: ~Bibliography 1517 r3 Q0 U, S! i6 \: m: m
Index 157 |
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