|
2#
樓主 |
發表於 2010-6-25 08:50:33
|
只看該作者
Abstract -- The diode operated in forward-biased condition has
1 o& w! E0 S9 s) ]; Sbeen widely used as an effective on-chip ESD protection device at! i( s% I2 W9 }
GHz RF and high-speed I/O pads due to the small parasitic
; _' P; W. t! W: Lloading effect and high ESD robustness in CMOS integrated0 G9 e$ N3 C1 L- r0 }
circuits (ICs). This work presents new ESD protection diodes
5 O1 V, J% _* C) V* H Lrealized in the octagon, waffle-hollow, and octagon-hollow layout5 \, f$ I, R$ l( c+ n8 G5 T8 }
styles to improve the efficiency of ESD current distribution and
- B6 S* P3 j7 B. ]/ J3 r+ Ito reduce the parasitic capacitance. The new ESD protection) c3 U3 ]) F) l2 s0 q% D
diodes can achieve smaller parasitic capacitance under the same
$ e4 \5 M) G1 _0 ?& g# z& q$ n8 GESD robustness level as compared to the waffle diode. Therefore,, V' f+ _/ [! @+ y" @
the signal degradation of GHz RF and high-speed transmission
& h: X* n- c& ?/ a' J* X0 ~$ ?can be reduced due to smaller parasitic capacitance from the new% w) z+ s. _* Z4 L g( Z
proposed diodes. |
|