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測試工程師,你覺得這份量測榜單如何?如果讓你選明年最想玩的3套量測設備,你會選哪幾個?
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”Best in Test”獎項為每年頒發一次,主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域,無論是產品的製造廠商或是使用者,都可以分別就各領域項目,針對上一年度廠商所發表的產品提名。挾著65,000份的發行量,Test & Measurement World在T&M貿易期刊中占有十足的影響力,目前擁有 130,000 讀者,55 % 為管理階級。0 q( h- m" \- j( ?& g# _* i# n4 w
' v. z# G4 o& e7 z R, [. DTest & Measurement World, 12/1/2006
5 S7 k$ Y' I, d$ Y* B, U2 vhttp://www.reed-electronics.com/tmworld/article/CA6401689.html2 U1 W) U9 w& o. B5 \
9 o, ^# d1 t& W, C, \- e9 f1 ]2007 Best in Test Award Winners ) C9 B' S F# H
DIGITAL MULTIMETERS1 \( l/ s; P* q6 y* o/ J2 V" p
8846A digital multimeter, Fluke% d0 V. b) O1 C9 u$ x
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AUDIO TEST' }% E/ V2 p4 m9 ~" S' K
APx585 audio tester, Audio Precision. f/ x8 n8 E' \
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WAVEFORM GENERATORS( V# E( _% i! [7 A" `+ T+ c( O0 B; x
AWG7000 series arbitrary waveform generators, Tektronix+ Y5 E2 z+ P9 G9 j F
$ u v, H, {2 b kDATA-ACQUISITION
$ u6 |4 j v9 H l+ lCompactDaq USB-based data-acquisition system, National Instruments; G; {& N. f L7 v8 U( t
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RF/MICROWAVE TEST
& Y }* L8 {" dFSUP signal source analyzer, Rohde & Schwarz2 _+ ]* [0 e8 m$ x* B
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OSCILLOSCOPES
3 t2 D: D2 L( L4 lInfiniium 80000B series oscilloscopes, Agilent Technologies
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MEMS TEST
! w7 h+ M' ]( ?! pInFlip MEMS strip-test module, Multitest
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( }+ L/ r. d) W w; l8 \PROBING SYSTEMS
( }0 {0 ~5 G3 Y. |M150 Measurement Platform, Cascade Microtech
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' m: P2 U% [; r/ r8 XAUTOMATED OPTICAL INSPECTION2 s' [0 R% C* |1 \
OptiCon BasicLine 1M/4M AOI system, Goepel electronic
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WIRELINE COMMUNICATIONS' u$ M2 b: ?4 \6 o; {3 Y. A
Spirent Protocol Tester, Spirent Communications C( l+ y5 ]5 ~3 u, d
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BOARD TEST5 Y/ w: B. J6 ~ q
TapCommunicator boundary-scan interface, JTAG Technologies
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SEMICONDUCTOR TEST& k. c, d% E2 O3 ^
Test Management Solutions software, OptimalTest
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2007 Best in Test Awards—Honorable Mentions
) L4 ], \9 Y) k" f9 a7 eWaveRunner 204Xi oscilloscope1 g Z6 o( r$ ~9 y# W3 g
LeCroy, www.lecroy.com4 H! L4 X/ G& C9 p
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SystemBIST FPGA configuration device! O( z- d F1 e4 M
Intellitech, www.intellitech.com5 k% ~3 c3 P& T) T
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Vanguard Express AMC protocol & link analyzer
" i2 Z1 M( ^2 P' {Vmetro, www.vmetro.com
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BBWGD 16-channel mixed-signal module for SoC test
9 L$ b9 u- x6 W1 \. @9 D! t8 \, \Advantest, www.advantest.com
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) R& m/ T$ C! L& {2 z: cN9020A MXA signal analyzer" L6 }" H7 |% I8 u7 Y5 J
Agilent Technologies, www.agilent.com8 k/ R$ ^6 H: s) @: `
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Signature MS2781B signal analyzer5 q- J7 T# B3 D* F
Anritsu, www.us.anritsu.com8 q: J: P. P5 K8 p
3 W- m# i7 N5 b2 f: d4 b9 q7 m- gDPO4000 oscilloscopes with Wave Inspector8 _5 Z: P; i) f9 p
Tektronix, www.tektronix.com! x! i; n* A! E% ?
% n. m3 R! _7 S0 W6 ^* [Medalist iVTEP vectorless test software
4 x0 I+ \& B. }' q$ EAgilent Technologies, www.agilent.com
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- K' h. D' d" u, _/ _( @2 aV93000 HSM high-speed DRAM tester9 \4 T: J/ } v8 U# {
Verigy, www.verigy.com
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/ X3 ]5 H8 z! o* VSiloti SilVE visibility enhancement tool7 B3 K! q& U1 N1 \! ]4 Q5 [9 U" d; u
Novas Software, www.novas.com+ J6 w- k2 ~( T: u9 @ G; Y
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E2960B Series protocol analyzer/exerciser for PCIe21 Q* d( ?! B" P7 `. k$ e
Agilent Technologies, www.agilent.com
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. B4 D+ I* y: U0 o- x9 N2 VR&S ESU EMI test receivers
! e F0 V4 C7 \( bRohde & Schwarz, www.rohde-schwarz.com: ?& P1 D1 e1 f; y6 ]
7 k" K- t9 f8 j. e4 uModel 2910/2810 vector signal generator/analyzer
" C7 `# x# x) N7 Q7 N' @; eKeithley Instruments, www.keithley.com |
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