ESD的另一种情况：CDE（Cable Discharge Event）

semico_ljj

ESD的另一种情况：CDE
" j8 ^6 b) f5 D  w3 |( iCDE--Cable Discharge Event

% U# |1 a+ W: u# c' p! [Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology

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semico_ljj

Abstract—Cable discharge events (CDEs) have been found
6 J( C1 u/ l+ c to be the major root cause of inducing hardware damage on
0 m0 C4 e2 G3 T- `5 |* Q Ethernet ICs of communication interfaces in real applications. Still,
there is no device-level evaluation method to investigate the ro
bustness of complementary metal–oxide–semiconductor (CMOS)
devices against a CDE for a layout optimization in silicon chips.

semico_ljj

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hansonzhao

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