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Functional verification |
Power-aware functional verification & modeling |
Transaction-based verification, modeling & acceleration |
Hardware/software co-verification - ISX |
Verification planning and management |
Testbench development and automation |
Assertion-based Verification |
Formal Analysis |
Simulation debug and analysis |
Analog-mixed signal system verification |
Silicon debug in-circuit emulation |
Platform VIP Reuse |
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Digital IC design |
RTL synthesis |
Formal verification |
Low-power design/estimation in front end |
Low power design implementation and analysis |
Design for test/yield/manufacturing (DFT, DFY & DFM) |
Constraints management and timing analysis |
Hierarchical layout, prototyping, and planning |
Physical optimization, routing and timing closure |
Dealing with ECOs |
Coping with variation during implementation |
Signoff (timing, power and SI) |
Physical verification (DRC, LVS, EM) |
New technologies challenges |
IP design and reuse |
High-performance design |
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Custom IC design |
Analog/RF parasitic extraction and simulation |
High-frequency challenges and solutions |
Statistical simulation |
Circuit optimization |
Full custom floorplanning |
Physical automation/ optimization |
Physical verification |
Voltage drop/electromigration |
Mixed-model/mixed-signal simulation and analysis |
Test for analog/mixed-signal designs |
IC 6.x Adoption |
Deep submicron challenges/solutions |
Modeling/characterization |
Analog/Mixed signal methodology enhancement |
RF Design methodology enhancement |
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Silicon-Package-Board |
Front-end design capture |
Constraint-driven design |
Design partioning and reuse |
Library and data management |
Integration with PLM systems |
Infrastructure and customization |
Interactive and automatic routing |
Design for manufacturing and testability |
Signal and power integrity analysis |
Simulation model development |
Multi-gigahertz design |
Design process and automation |
Algorithmic-based model development |
Designing in DDR2 memories |
Silicon/Package co-design |
Rapid feasibility prototyping methodologies |
DFM verification of complex IC Packages/SiPs |
Package-On-Package design techniques and challenges |
RF SiP methodology enhancement |
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Special Interest |
OpenAccess |
Reliability modeling |
Design for test/manufacturing and RET signal integrity |
Design reuse strategies |
Impact of standards on design optimization |
Configuration management |
Process design kit automation |
Platform-dependent methodology flows |
Linking of design and fab data to improve ramp yield |
DFY/DFM optimization techniques and results |
Interoperability |