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測試工程師，你覺得這份量測榜單如何？如果讓你選明年最想玩的3套量測設備，你會選哪幾個？4 j$ ?& N' p! f s0 ?' O
- v" u7 e9 ?7 Z# C( m+ V9 X! T”Best in Test”獎項為每年頒發一次，主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域，無論是產品的製造廠商或是使用者，都可以分別就各領域項目，針對上一年度廠商所發表的產品提名。挾著65,000份的發行量，Test & Measurement World在T&M貿易期刊中占有十足的影響力，目前擁有 130,000 讀者，55 % 為管理階級。2 a6 y8 Q2 @& r# _
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* M2 E+ X& D5 z) ]% ]Test & Measurement World, 12/1/20064 m0 Z! m' s- i% m% m& u; a7 U
http://www.reed-electronics.com/tmworld/article/CA6401689.html
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2007 Best in Test Award Winners ' `0 \4 o8 T( [
DIGITAL MULTIMETERS
, `: `3 V5 X$ S( Y, V0 a. {7 W8846A digital multimeter, Fluke
6 Z: {+ @) @ W; h: o5 b4 n) N, O# a' ^! S
AUDIO TEST: ~0 P5 h1 N) z& A. V, o9 ~
APx585 audio tester, Audio Precision
* _7 G/ f! w# m; e3 P, R9 A0 q. l/ O9 ^; @% ^. X4 e
WAVEFORM GENERATORS, f. l! f D# J7 D" h
AWG7000 series arbitrary waveform generators, Tektronix
- O. r0 ?9 f4 E5 ^2 v) `
: b, G' o' a4 _; X% T1 fDATA-ACQUISITION
6 D _& i, w& f: K" X4 XCompactDaq USB-based data-acquisition system, National Instruments
9 x: \5 k* c5 _3 }* y; E& G4 r1 m" j! C" V- |5 E1 a7 }$ y
RF/MICROWAVE TEST
# h0 Y$ p' u1 T2 X8 yFSUP signal source analyzer, Rohde & Schwarz
: Y$ R( o3 \5 F2 k; A
! F$ T, a$ J$ {- l$ cOSCILLOSCOPES0 p% W6 Z8 s/ U+ F
Infiniium 80000B series oscilloscopes, Agilent Technologies
5 P3 |5 e6 P8 ?. t0 j# r- k% \' a7 D
MEMS TEST; g4 r& ?1 |# y. Y/ Y% ^- `7 G) k
InFlip MEMS strip-test module, Multitest6 g: V# X4 M7 m: h S2 H
0 E6 l& T1 ~2 @9 C# ]' R
PROBING SYSTEMS
9 `% Z! d' u! `7 mM150 Measurement Platform, Cascade Microtech! t. ?, \. o% I. q" v
$ _% v- z5 E, M, W
AUTOMATED OPTICAL INSPECTION/ L& N4 Y( }- l0 E o! J, E2 q
OptiCon BasicLine 1M/4M AOI system, Goepel electronic3 u. o6 @2 I# }
9 B1 J, }, w" L+ a% J3 mWIRELINE COMMUNICATIONS
# z/ v) G/ A7 v( v5 F, F+ ^* hSpirent Protocol Tester, Spirent Communications d, ?( b! o& n+ ^
% n. `0 V, X3 @ z2 n ?7 {
BOARD TEST
6 v2 D: k' c5 T. z# H' q8 UTapCommunicator boundary-scan interface, JTAG Technologies
2 m+ P( [. b6 G n" A9 F
5 N" A. b, P ~# @% tSEMICONDUCTOR TEST7 y" x! \* S5 w
Test Management Solutions software, OptimalTest
# J. }! m4 c% ~) u8 ?+ s1 [$ S2 C- R
2007 Best in Test Awards—Honorable Mentions: T' j& L$ I4 h. G8 v- o3 w
WaveRunner 204Xi oscilloscope2 m( t+ l* }" x& T& x' h& [
LeCroy, www.lecroy.com: |. O. b. |& ]# S. S& X( Q: B
8 F# D. W; w8 C+ e. [SystemBIST FPGA configuration device
9 B# A- f F0 }4 f: lIntellitech, www.intellitech.com
# P3 L, Z2 `6 h/ L# G
0 c1 u+ j- i4 f! I/ ^3 P( L; d3 IVanguard Express AMC protocol & link analyzer
/ d, Q2 u" d4 _: H. QVmetro, www.vmetro.com
# o" b" S: V. L: [( P1 p' }5 M, b8 }- T4 r; ~( C) L" [7 _+ M
BBWGD 16-channel mixed-signal module for SoC test
7 R; U- F) R2 WAdvantest, www.advantest.com/ s2 q$ w0 @5 z( G- V" z1 m, d
! k/ R+ c% ]. l* {N9020A MXA signal analyzer
6 e6 l) [# m" A1 \/ UAgilent Technologies, www.agilent.com& R! D$ x: k& i, j3 J. I; l2 i
' R; A7 y, l# y( K
Signature MS2781B signal analyzer
: [6 ?8 Z) R0 i6 i$ j, oAnritsu, www.us.anritsu.com- X) ~1 k' {$ O: |( J, |& L
* |' @* `" y9 I2 T& b8 qDPO4000 oscilloscopes with Wave Inspector/ W: j. b/ Z# `: \9 p' b( S4 T' j5 Y
Tektronix, www.tektronix.com
; p6 o# w$ E6 f C: G
3 M& `' w: Y& Q( N7 xMedalist iVTEP vectorless test software- C5 f. V% J* e8 U k( a
Agilent Technologies, www.agilent.com
8 p) Y- _( P& N. X7 w2 s: [" Y3 |: n/ Z. K6 t6 U% j
V93000 HSM high-speed DRAM tester- D/ c% b1 b$ w$ c
Verigy, www.verigy.com
4 y& E |- S2 i0 w3 C4 X I
1 } h; [& Q3 n4 vSiloti SilVE visibility enhancement tool
' C4 _9 _2 h% a- s0 tNovas Software, www.novas.com l: ~/ _7 ~1 Q3 c% E6 |
( @' t, }: [- n) o# RE2960B Series protocol analyzer/exerciser for PCIe2
2 ~ v, ~- Z2 g5 TAgilent Technologies, www.agilent.com / }, N' D O5 _3 b9 P( R) E, ?5 \
' j% Q }3 p$ ^! Q7 v
R&S ESU EMI test receivers
/ ]+ y- V3 X# m* o5 Q5 YRohde & Schwarz, www.rohde-schwarz.com
! N/ q4 \0 K$ f
! h4 j/ g( b% e7 c) N5 gModel 2910/2810 vector signal generator/analyzer
! @. y( S0 S1 B% i/ TKeithley Instruments, www.keithley.com |
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