Abstract—Cable discharge events (CDEs) have been found, [# R# q; s2 z% P
to be the major root cause of inducing hardware damage on* F' d3 m6 g4 A1 w! u
Ethernet ICs of communication interfaces in real applications. Still, # t; j- }9 T/ P there is no device-level evaluation method to investigate the ro . k) y; ?. b- o) V3 N$ s2 ] bustness of complementary metal–oxide–semiconductor (CMOS)! W2 z& X0 C3 ^& I' R$ K' c- @
devices against a CDE for a layout optimization in silicon chips.