|
Layout Guidelines for Optimized ESD Protection Diodes2 Y1 z& j; q; B% U2 [8 c
0 g; _3 m& ?8 K( X0 H8 k! w0 oKaran Bhatia and Elyse Rosenbaum* r7 d. \( B3 r7 E
Department of Electrical and Computer Engineering • University of Illinois at Urbana-Champaign
. U2 f z- G8 F$ _4 U4 R1308 W. Main St., Urbana, IL 61801 • Tel. +1-217-244-0578 • Fax +1-217-244-1946 • Email: ksbhatia@uiuc.edu
& @2 z2 J6 ^- K; J# R3 m( m- g8 |: w+ ]# E
Abstract - In this work, various layout options for ESD diodes’ PN junction geometry and metal routing are# w* y$ R4 T3 F( z F/ {' C5 ^
investigated. The current compression point (ICP) is introduced to define the maximum current handling
5 L. e. }; Y3 Y; {8 m4 y( N5 bcapability of ESD protection devices. The figures-of-merit ICP/C and RON*C are used to compare the
- z0 x! u* U# F+ I; k- n/ ?% Nperformance of the structures investigated herein. |
本帖子中包含更多資源
您需要 登錄 才可以下載或查看,沒有帳號?申請會員
x
|