ESD的另一种情况：CDE（Cable Discharge Event）

semico_ljj

ESD的另一种情况：CDE
CDE--Cable Discharge Event

Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
9 h  z0 i4 V: Q

遊客，如果您要查看本帖隱藏內容請回復

semico_ljj

Abstract—Cable discharge events (CDEs) have been found
& [. \/ G) X+ U. ]. q+ J8 j to be the major root cause of inducing hardware damage on
Ethernet ICs of communication interfaces in real applications. Still,
! K  o4 y6 i3 X) z4 d8 L there is no device-level evaluation method to investigate the ro
bustness of complementary metal–oxide–semiconductor (CMOS)
+ f/ j8 R6 {7 P1 V1 h# t4 r7 m4 h devices against a CDE for a layout optimization in silicon chips.

semico_ljj

谢谢支持！

hansonzhao

好冬冬，楼主辛苦了
希望楼主多多提供