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測試工程師,你覺得這份量測榜單如何?如果讓你選明年最想玩的3套量測設備,你會選哪幾個?
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”Best in Test”獎項為每年頒發一次,主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域,無論是產品的製造廠商或是使用者,都可以分別就各領域項目,針對上一年度廠商所發表的產品提名。挾著65,000份的發行量,Test & Measurement World在T&M貿易期刊中占有十足的影響力,目前擁有 130,000 讀者,55 % 為管理階級。
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# Y8 D" ?4 E8 y' tTest & Measurement World, 12/1/2006
' Q2 I* e6 e, k4 P/ t X4 ihttp://www.reed-electronics.com/tmworld/article/CA6401689.html
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2007 Best in Test Award Winners " j5 a" P8 C1 m2 ?7 ^4 w
DIGITAL MULTIMETERS
1 j2 x* I! ]' t% \" J% [8846A digital multimeter, Fluke: A B0 t* a3 M+ j( Q( h3 E1 `
, `; C' L! q5 B/ J5 }7 o! iAUDIO TEST* c4 A- e0 ] C
APx585 audio tester, Audio Precision6 }8 m' D% F3 P+ m" ]
& m1 D9 W# l/ s0 t5 ]0 C' Y% bWAVEFORM GENERATORS
8 U3 O" m; u, r6 G5 n rAWG7000 series arbitrary waveform generators, Tektronix
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; K) U: v( I& [4 L7 v# BDATA-ACQUISITION4 W j: n# o( D% `
CompactDaq USB-based data-acquisition system, National Instruments
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{6 h$ g8 l7 y9 nRF/MICROWAVE TEST* ~" p: c8 U7 v1 }8 e
FSUP signal source analyzer, Rohde & Schwarz y- m4 j/ g/ B
3 G% L' o8 O- m. Y$ D7 fOSCILLOSCOPES
, G9 D0 u; d. a' DInfiniium 80000B series oscilloscopes, Agilent Technologies
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" Y- f' K. z* e @8 GMEMS TEST( r0 K% m2 G! a$ X; o
InFlip MEMS strip-test module, Multitest
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" x7 U; A5 [4 k0 b2 S- bPROBING SYSTEMS( c3 U1 x; c4 T5 M+ n/ `5 ]3 g+ |; \
M150 Measurement Platform, Cascade Microtech
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+ V1 D4 Q- y8 D _3 DAUTOMATED OPTICAL INSPECTION
8 ^- v @* N9 A" q. k( lOptiCon BasicLine 1M/4M AOI system, Goepel electronic
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1 T% M. L! A5 U7 y# x; M aWIRELINE COMMUNICATIONS
9 @1 _, m, n; m5 l; d+ w# ?3 uSpirent Protocol Tester, Spirent Communications
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BOARD TEST- s. J$ E1 z, `8 z
TapCommunicator boundary-scan interface, JTAG Technologies, U" T# S9 Y: e7 z* ?4 Q Q
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SEMICONDUCTOR TEST
/ u9 |% C+ l% R( g4 A. Z' KTest Management Solutions software, OptimalTest2 i T3 R: A& ^; x. b; j
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2007 Best in Test Awards—Honorable Mentions& k7 F# ?! @! }3 E) {
WaveRunner 204Xi oscilloscope" b. x2 f3 o' x
LeCroy, www.lecroy.com
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SystemBIST FPGA configuration device
2 X: ^' M: j7 m" ]8 K* p: P! YIntellitech, www.intellitech.com$ W& K4 o! z0 p: x# |% N
$ J( ?; t) E9 KVanguard Express AMC protocol & link analyzer# \: y9 |4 a+ b9 B+ \' B# `3 X2 s
Vmetro, www.vmetro.com! ^5 ~; \4 y' y6 j
+ d' [# \+ C5 [/ A) hBBWGD 16-channel mixed-signal module for SoC test! q/ C' |! C' B% ^
Advantest, www.advantest.com
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N9020A MXA signal analyzer) ]: S/ d3 B- z8 W& z& p* J
Agilent Technologies, www.agilent.com2 w1 z1 i7 }2 V0 [$ K% x- J
0 F: L: ~3 A+ p( ~& C4 CSignature MS2781B signal analyzer
) A( I' y. A% [Anritsu, www.us.anritsu.com
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8 @+ t7 x1 R) c4 cDPO4000 oscilloscopes with Wave Inspector
! O: G) l9 ~1 v7 e0 ?Tektronix, www.tektronix.com
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5 Y q1 T/ J W8 nMedalist iVTEP vectorless test software
1 j5 C4 N% v1 k7 ~1 { CAgilent Technologies, www.agilent.com' E: t6 }7 f" |6 r( |3 _
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V93000 HSM high-speed DRAM tester
6 t/ ?8 B) r* [# Q# gVerigy, www.verigy.com
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* F% q. Q) t3 r! [, |Siloti SilVE visibility enhancement tool& K( ^9 w) Z4 }
Novas Software, www.novas.com
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2 k. A) \% c YE2960B Series protocol analyzer/exerciser for PCIe2
! X; c* U9 E" o% W/ [5 ~4 o- xAgilent Technologies, www.agilent.com ' u( a( n: z% i0 x7 {
/ h8 w; r* `0 t# KR&S ESU EMI test receivers8 k8 F, S6 j Y3 i: \
Rohde & Schwarz, www.rohde-schwarz.com
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y5 }' _0 S a, `Model 2910/2810 vector signal generator/analyzer
1 T P' m# f) w+ j9 ^Keithley Instruments, www.keithley.com |
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