|
測試工程師,你覺得這份量測榜單如何?如果讓你選明年最想玩的3套量測設備,你會選哪幾個?
7 P) v2 ^2 W$ E
- k" O+ Z; f! w. y”Best in Test”獎項為每年頒發一次,主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域,無論是產品的製造廠商或是使用者,都可以分別就各領域項目,針對上一年度廠商所發表的產品提名。挾著65,000份的發行量,Test & Measurement World在T&M貿易期刊中占有十足的影響力,目前擁有 130,000 讀者,55 % 為管理階級。# \5 }) O; T, U9 m7 ?& K
( `3 t# w& x- Z7 g
Test & Measurement World, 12/1/2006- c' A8 C+ _+ q: E) q$ ?" e
http://www.reed-electronics.com/tmworld/article/CA6401689.html
; o H5 B1 ]/ Y( b. y# q+ j' u9 U& [3 h3 r, ~, f8 F
2007 Best in Test Award Winners
( x4 D2 G1 ]' m) L2 r* f, JDIGITAL MULTIMETERS
: Y: A9 z2 l) \% O/ D( W. |8 \& T8846A digital multimeter, Fluke2 T% w( Y4 Q0 f
$ z' m+ m3 v8 o s
AUDIO TEST# E- D# D2 i- W8 J
APx585 audio tester, Audio Precision
- r; T/ T3 z2 k3 N0 t7 K, L
1 r$ X& J+ X7 SWAVEFORM GENERATORS$ i! V1 g' b( M+ }: K
AWG7000 series arbitrary waveform generators, Tektronix, g, l: y9 ]6 D2 H! ^6 j
3 Z- r0 A" B; k; oDATA-ACQUISITION8 U' s0 p. [; T* z( z
CompactDaq USB-based data-acquisition system, National Instruments) m3 U3 H4 p7 k2 Q
; {. \# H4 h# I2 g8 I9 j! ^/ \) QRF/MICROWAVE TEST
: E; ~8 t; J5 s6 \5 v) F, M: NFSUP signal source analyzer, Rohde & Schwarz0 w3 ?- c f5 T) {+ @0 x3 A
1 I# Q2 y! F3 B0 QOSCILLOSCOPES
: s( Z/ V5 W" v- I6 fInfiniium 80000B series oscilloscopes, Agilent Technologies" _" n9 n# q0 W7 S7 E
' c3 Y, {0 G' O" \5 ~MEMS TEST* z& ^ O7 d, Q& k& w
InFlip MEMS strip-test module, Multitest
4 K& R5 X$ I2 `. s$ `5 L5 P9 Q7 v% d* `! Y/ V. I3 b5 W
PROBING SYSTEMS, b* P2 n( k. a
M150 Measurement Platform, Cascade Microtech
# U$ f% G" Z& ]' y" @! ^6 s
4 [/ E6 Q' w" [* n8 xAUTOMATED OPTICAL INSPECTION1 o5 Y5 y. L# l/ H( V J- K5 M4 ~, m/ P% H) q
OptiCon BasicLine 1M/4M AOI system, Goepel electronic& t& z% v1 g+ q% ^3 U
( s; ~0 K; G4 s
WIRELINE COMMUNICATIONS
3 _# X5 S% d* E" ]% wSpirent Protocol Tester, Spirent Communications
) z5 f8 J5 P e& |5 B' o5 w4 {' y6 W! Z3 w% e: c0 h
BOARD TEST
% V A; i5 m0 U6 c ~! F! a; W6 lTapCommunicator boundary-scan interface, JTAG Technologies. ^ Y" w. N2 b4 I. X* e
% W l( k( F+ P8 }5 ^6 m
SEMICONDUCTOR TEST
4 f! x* ~! I1 A/ x4 P8 @; }$ NTest Management Solutions software, OptimalTest
" W/ x2 G/ ^+ V7 ?2 P& P/ u: P8 {# ]9 g. h' c
2007 Best in Test Awards—Honorable Mentions# q+ S7 W8 {$ ?5 u& V3 V
WaveRunner 204Xi oscilloscope9 d: w5 ^" c) ^7 Q
LeCroy, www.lecroy.com
+ I1 h& ]4 R7 ~9 P" Z7 ^8 g* s4 k6 f0 l0 W/ s- n ~" Z
SystemBIST FPGA configuration device2 K" v0 J+ m, Z
Intellitech, www.intellitech.com
; |7 [! d/ e1 M" R
' J0 b- S2 Y9 j2 LVanguard Express AMC protocol & link analyzer2 |, p; J6 S$ d# g% [7 k5 e
Vmetro, www.vmetro.com9 e* V& O( P5 f# \8 k
8 Z K5 V6 g! h# \- j3 W- ]+ ~, d
BBWGD 16-channel mixed-signal module for SoC test- [' W- d0 o) Y5 |' }
Advantest, www.advantest.com* w3 o7 |; [3 {) g
' s9 t6 H& [' E8 G& [' V
N9020A MXA signal analyzer
. p! X1 s8 Z. u7 |0 O1 EAgilent Technologies, www.agilent.com$ Q6 L/ z* t/ Z% [2 X; I
4 a/ F- o3 V) f0 Z& o
Signature MS2781B signal analyzer4 ?) p- d1 G& N, l4 U7 q8 _: t3 n
Anritsu, www.us.anritsu.com* X2 h" l7 ^; B+ I8 w# X
* d1 T9 m7 ?) n- R4 ?: wDPO4000 oscilloscopes with Wave Inspector; A' a* {& p/ V& J6 Q
Tektronix, www.tektronix.com
+ h! M P/ H( j( N' ?* S
% Y7 T m" O: `' X EMedalist iVTEP vectorless test software
* z' h& x- H6 W% W# h% iAgilent Technologies, www.agilent.com
1 |5 z3 G: e' G/ W$ C
1 ~' d5 s$ K- C; U& C8 X( rV93000 HSM high-speed DRAM tester
$ d# @( u1 x9 r# C0 E6 ~Verigy, www.verigy.com" a* @+ t4 e, S0 p8 B( x) C
# q g0 _7 W, Z4 E
Siloti SilVE visibility enhancement tool
4 R3 x7 r3 S6 J! g3 B6 f& I xNovas Software, www.novas.com3 m+ N' v* k4 w
$ S7 p7 q a5 }7 x& D: y
E2960B Series protocol analyzer/exerciser for PCIe2
7 F# U, e/ U+ B" }9 Z' d: oAgilent Technologies, www.agilent.com - `6 j) @* B- d5 M: _+ e0 e" h
5 f5 ^ n7 f1 m
R&S ESU EMI test receivers
6 A3 n8 E+ b {- L: L+ C7 N6 T% kRohde & Schwarz, www.rohde-schwarz.com$ [. S. q( e5 o( S. \& _' F+ \
1 S* h1 |7 W5 a& B
Model 2910/2810 vector signal generator/analyzer
$ f- e8 T( H$ h' A- k/ S, J5 AKeithley Instruments, www.keithley.com |
|