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An ESD-Protected 5-GHz Differential Low-Noise Amplifier in a 130-nm CMOS Process% \3 x' Z0 Y, Q2 K! d* O. X8 P$ p
0 t6 D3 H7 V; A) |9 x) I/ WAbstract- A novel ESD protection design for radio-frequency (RF) differential input/output (I/O) pads is proposed and successfully6 A7 q2 g5 g1 H
applied to a 5-GHz differential low-noise amplifier (LNA) in a 130-nm CMOS process. In the proposed ESD protection design,% z: j' H2 L4 b% ]- I
an ESD bus and a local ESD clamp device are added between the differential input pads to quickly bypass ESD current, especially
# C* E6 N9 J% Lunder the pin-to-pin ESD-stress condition. With 10.3-mW power consumption under 1.2-V power supply, the differential LNA$ k/ J* P% v- e8 }: D) x: E
with the proposed ESD protection design has the human-bodymodel (HBM) ESD robustness of 3 kV, and exhibits 18-dB power gain and 2.62-dB noise figure at 5 GHz. Experimental results have demonstrated that the proposed ESD protection circuit can be co-designed with the input matching network of LNA to simultaneously achieve excellent RF performance and high ESD robustness.2 T4 Y7 B+ C& O: W
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