IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture

michaldl

Sponsor
Test Technology Standards Committee of the IEEE Computer Society
Approved 14 June 2001
IEEE-SA Standards Board
+ M, _: }. r# J; r" [& q1 @; D+ zAbstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
- j9 F& s& h8 i" Q* B% }! s8 N8 bsupport of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
+ z; b, k; W) @! K" Iincluding a boundary-scan register, such that the component is able to respond to a minimum set
+ O6 L& U: Q. L0 Mof instructions designed to assist with testing of assembled printed circuit boards. Also, a language
. C- @* i- W5 }: lis defined that allows rigorous description of the component-specific aspects of such testability features.
& m. [7 g% u/ C- j
Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,
boundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
TAP, test, test access port, VHDL, VHSIC Hardware Description Language
9 m$ A$ f- r2 s% M' Q( @

遊客，如果您要查看本帖隱藏內容請回復

madsilly

目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture
0 O4 ^4 l  |5 w2 Z3 Y3 a5 }, N. K支持一下啦  謝分享

madsilly

目前正在Study JTAG電路部分 對小弟應該頗有幫助 感恩啦

leowang

目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture
感謝樓主分享

sslin

目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture
5 N5 |& n" B$ T$ q; A支持一下啦  謝分享

wpwang

目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture6 e; c- N" I6 X6 J$ m
2 {. N8 J- X5 N8 h' M# I& E支持一下啦  謝分享

pauls

這東西~~現在極迫需要~~希望內容清晰~~多謝大大的分享~~~