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測試工程師，你覺得這份量測榜單如何？如果讓你選明年最想玩的3套量測設備，你會選哪幾個？
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”Best in Test”獎項為每年頒發一次，主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域，無論是產品的製造廠商或是使用者，都可以分別就各領域項目，針對上一年度廠商所發表的產品提名。挾著65,000份的發行量，Test & Measurement World在T&M貿易期刊中占有十足的影響力，目前擁有 130,000 讀者，55 % 為管理階級。
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Test & Measurement World, 12/1/20060 {" e2 Q0 u* e
http://www.reed-electronics.com/tmworld/article/CA6401689.html# C; d4 t5 a5 J/ |* I! A' y9 ]
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2007 Best in Test Award Winners ) M2 t& ~: P7 N
DIGITAL MULTIMETERS3 N$ m3 w4 N% r/ w; ~, k
8846A digital multimeter, Fluke: X1 Y8 R& M7 e: v
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AUDIO TEST
! Z* x4 C. a! ^APx585 audio tester, Audio Precision
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6 E/ J" Z: D; P% @+ @4 @WAVEFORM GENERATORS5 E& @& C1 j+ I, T; b4 H
AWG7000 series arbitrary waveform generators, Tektronix
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DATA-ACQUISITION
9 l4 i" |. M. y3 K6 Z: G1 RCompactDaq USB-based data-acquisition system, National Instruments
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/ p% s2 s' v% ?% eRF/MICROWAVE TEST
$ ]" X7 ?, @ a9 h' @2 k# BFSUP signal source analyzer, Rohde & Schwarz
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; `* N% K" ?5 o1 o8 X5 y1 OOSCILLOSCOPES
, u9 N2 r" j& v" aInfiniium 80000B series oscilloscopes, Agilent Technologies5 M& m, k) B0 U, P+ O e
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MEMS TEST
" Q( f5 g3 z" q% \0 N6 K5 JInFlip MEMS strip-test module, Multitest1 B$ ?. ]' ~. ]% M" R1 l
4 ^& G7 _, l' n( d2 |; s# O% uPROBING SYSTEMS1 {( u' @' C$ w* y% G: z; D- h
M150 Measurement Platform, Cascade Microtech6 y5 k5 j W* `
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AUTOMATED OPTICAL INSPECTION: ~3 N8 P+ f2 }" h% A. S
OptiCon BasicLine 1M/4M AOI system, Goepel electronic
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WIRELINE COMMUNICATIONS
, K/ @% o, }0 r; Q* ^Spirent Protocol Tester, Spirent Communications1 H6 M/ Q2 n4 w2 B
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BOARD TEST
/ j& q. B! A3 _4 j' jTapCommunicator boundary-scan interface, JTAG Technologies
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0 {$ g" y. O) N3 M8 q$ \' N3 _# I7 XSEMICONDUCTOR TEST+ {. U5 u v: \4 j) ~
Test Management Solutions software, OptimalTest9 g) c3 H, T& s" i' N4 H* }4 Y
7 N8 Z& H: y* l6 a. c4 k2007 Best in Test Awards—Honorable Mentions
, p2 o; K, e0 `: @3 j- W- W, s; jWaveRunner 204Xi oscilloscope! Y4 Y" u4 f& U) A4 h$ n+ {
LeCroy, www.lecroy.com
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SystemBIST FPGA configuration device6 n# ^: _, Z, v- }) L/ |
Intellitech, www.intellitech.com4 p3 A" c$ Q' c; d1 A u0 `
# @$ |$ J$ K) u. h, OVanguard Express AMC protocol & link analyzer2 s1 h2 E" M# w c; s, }2 K
Vmetro, www.vmetro.com4 W3 l8 |; q/ K X# I2 W2 d. d
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BBWGD 16-channel mixed-signal module for SoC test" j8 Z& l3 V1 u2 E# r% r
Advantest, www.advantest.com. I6 X: ^: d& e, g i; y0 R% k
$ ^0 l1 c5 B9 R/ kN9020A MXA signal analyzer
% ~* r" \* a$ t1 U. i; d8 XAgilent Technologies, www.agilent.com
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Signature MS2781B signal analyzer$ X2 g) Q; i8 ]5 _
Anritsu, www.us.anritsu.com8 h1 A! I4 P0 R8 P; F7 p/ ?5 }7 }6 X* N
5 @& B$ `0 F3 E D. b0 V7 f, SDPO4000 oscilloscopes with Wave Inspector
7 E9 q, s7 G% H8 R4 G* C* ATektronix, www.tektronix.com0 ~. B6 J" W8 q# Y
' o; |" D" c( ]/ LMedalist iVTEP vectorless test software
2 A) {' K) l; Q! NAgilent Technologies, www.agilent.com+ M% O( P% n9 Z7 K- x A$ S
& r/ e3 p$ K8 {7 [6 B" ]V93000 HSM high-speed DRAM tester
0 G( K6 F1 p/ pVerigy, www.verigy.com
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Siloti SilVE visibility enhancement tool/ E. u' C6 K/ H% [ G4 Y
Novas Software, www.novas.com
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$ A( z/ N2 I3 R9 DE2960B Series protocol analyzer/exerciser for PCIe2
7 |; o# ~, m- i/ S: y/ ]* i/ wAgilent Technologies, www.agilent.com ; Q% B% s [0 `$ q2 u# Y: \
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R&S ESU EMI test receivers- z( H4 F" d9 R6 T# m8 `7 r2 X
Rohde & Schwarz, www.rohde-schwarz.com3 B: T' |* J) j! ~ A0 \5 c
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Model 2910/2810 vector signal generator/analyzer# g' E$ d2 h0 n4 D6 U4 o8 f
Keithley Instruments, www.keithley.com |
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