ESD的另一种情况：CDE（Cable Discharge Event）

semico_ljj

ESD的另一种情况：CDE
CDE--Cable Discharge Event
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3 Q& P  X7 Z1 M6 z$ B  C6 AInvestigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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semico_ljj

Abstract—Cable discharge events (CDEs) have been found
to be the major root cause of inducing hardware damage on
& b* d9 s; z, X9 _3 J: `, Y' |# L Ethernet ICs of communication interfaces in real applications. Still,
( Z: W6 u7 E+ p' \$ Z: f! R% H  U there is no device-level evaluation method to investigate the ro
bustness of complementary metal–oxide–semiconductor (CMOS)
# H3 v% X) c$ g devices against a CDE for a layout optimization in silicon chips.

semico_ljj

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hansonzhao

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