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Layout Guidelines for Optimized ESD Protection Diodes
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! T" V. p. X k5 @+ jKaran Bhatia and Elyse Rosenbaum/ ^* p3 P3 x/ N$ E& M/ G
Department of Electrical and Computer Engineering • University of Illinois at Urbana-Champaign
: j- [( t6 X; o& ?/ b1 n2 o7 Z. V x8 ~1308 W. Main St., Urbana, IL 61801 • Tel. +1-217-244-0578 • Fax +1-217-244-1946 • Email: ksbhatia@uiuc.edu
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9 B; H3 N( b2 l7 \* fAbstract - In this work, various layout options for ESD diodes’ PN junction geometry and metal routing are
m9 _ t" n o) z- vinvestigated. The current compression point (ICP) is introduced to define the maximum current handling
) j/ g/ z6 [7 a& h9 r7 w5 Xcapability of ESD protection devices. The figures-of-merit ICP/C and RON*C are used to compare the6 M3 l; o( S9 T1 }' ?5 H, n6 d
performance of the structures investigated herein. |
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