靜電放電測試

ritafung

剛剛研究了靜電放電（ HBM ＆ MM） JEDEC標準，實在需要很長的時間去進行測試。假設該IC具有數以百計的pin，很可能將需要超過1個月完成整個測試。這裡是否有任何人負責做ESD測試？

ritafung

thanks wesleysungisme for your answer.
as our pin count is over 1000 and no. of power is ~ 20, so it's quite time-consuming.
and there is technical issue about bonding all the dies into COB for ESD zapping, i wonder if anyone could share their practise? we feel difficult to strictly follow JEDEC standard.

f5882077

樓上的Jason...據我所知大部分的IC設計都會跑去宜特做ESD...為什麼你要特別建議去閎康做呢??
, ~" t# b* j7 t/ e有什特殊原因嗎??會比較適合的邏輯是什麼??是否可分享一下心得??感恩~

wesleysungisme

For ESD test (HBM)
% b( s! ^8 m5 K0 zThe following are the test combination:
1. Power to Power
2 ~& x$ d0 Q: H2. Power to Ground
6 N8 M) a$ ]; s8 R3. IO to Power
4. Io to Ground
1 T$ t0 J0 g5 X! ]% n. S5. IO to IO
% M2 B' x5 d7 A. n( }* l# S(different power domain need to be treated as different power. For ground usually you can treat as one group_silicon use substrate as common ground. But if you measure two different ground pin/ball > 2ohms. It should be seperated as 2 grond.)

the total zap time fomula will be~ 2(+/- polarity) X (IO#X(P#+G#)+IO#+P#X(P#-1)X(P#-2)X...X1+P#XG)
% t/ D; P0 y: [( @# y5 KFor example: You have IO1/IO2/IO3/P1/P2/G1
, s0 D* T8 X& O2 z% e2x((3X(2+1)+3+2X1+2X1)=25(multiple the zap interval)
So for high pin count it will take a lot of time. But it won't take more than a week(for one chip).

4 ]% [+ s* |% AFor your reference.

ritafung

my company is pursuading to MIL-Std ...
actually any company need MIL-Std? Our application is not for military purpose....

kyyyyyykimo

目前新竹地區有"宜特"與"閎康"兩家比較大
# |. D7 d( d% F$ S" |) H8 L: q我的建議是去閎康，會比較適合。
因為我本身工作性質也是有接觸到ESD測試
測試多Pin需要花費時間比較長久，可是你們HBM是使用JECDE
在Zap的次數明顯比軍歸來的少了。

cuban487

很多實驗室好像都有,但都在台北.
儀特好像就有可以去查ㄧ下

m851055

竹科閎康科技有此業務
( s+ U9 Y0 f& u電話在網頁就查的到了.......................