e-Manufacturing & DFM Symposium 4/1開放報名

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Keynote邀請到前清大校長劉炯朗擔任
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  　　This is the first e-Manufacturing symposium organized by Taiwan Semiconductor Industry Association (TSIA) aiming to forge stronger links between the Academia and the Industry on complementary and collaborative efforts in maintaining the national leading edge competitive advantages and capabililities among the world's manufacturing bases.
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' u/ s% p, d$ b　　The Symposium initiates to offer a common arena for academics and professionals of business operators, concept creators, product designers, commondity manufacturers, hardware suppliers, software vendors, independent consultants, network distributors and logistics controllers to exchange fundamental concerns, to discuss immediate outlooks and future trends, and to explore the uncharted territories altogether.
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chip123

e-Manufacturing & DFM Symposium 2008 (AJoint Symposium with AEC/APC-Asia Symposium 2008) hosted by TSIA will be held on November 27-28, 2008 at Ambassador Hotel HsinChu. Please submit your abstract to symposia@tsia.org.tw.
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Topics of interests include, but not limited to, the following:

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) E+ D8 \% P$ O; g' c  ?Applications in high-volume manufacturing
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( X  g/ |; R* c9 i/ v8 d" MAutomated Material Handling System
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Benefits and justification (ROI, CoO, OEE…)
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Control Architecture/Engineering/IT Infrastructure
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4 ]( t+ I( V( u9 D) y. ^( ]Data Collection/Quality/Storage/Management
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8 v4 v2 b4 q  s2 W7 Y$ h# SDesign for Manufacturing/Testing/Yield
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/ Z; p  d) \5 B1 Ke-Diagnostics, e-Manufacturing, and EEC
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) p# k* N9 u1 R) C/ OEngineering/Supply/Value Chains
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Equipment Communication/Integration
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, d7 l% z! c2 l" U' v9 xFactory Integration/Operations
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Factory-Wide Applications and Deployment
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Fault Detection & Classification
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Future APC/FDC Needs and Requirements
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Integrated/Virtual Metrology
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Manufacturing Execution Systems
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Real-Time & Defect/Yield Databases
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& Z8 ?' `, ]+ MPiggyback and SCADA controllers
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Predictive/Preventive Maintenance
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Process modeling and model-based control
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6 D) Y2 G+ S5 _: ^Real-time data collection and management
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0 N2 v# h1 V, h5 e( C, _( ~Real-Time Decision-Making
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5 W2 T3 e/ A" u  e- kRun-to-Run/Wafer-to-Wafer/Real-Time Control
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Scheduling & Dispatching
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: N( |; v* @5 l5 v( \9 v  l0 ^5 q5 p  KSensor development and implementation
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7 t4 O. y1 Z* U! qSensor integration into existing process tools
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Sensor/actuator bus and intelligent sensors
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7 C" z: D% T. o9 `; CSpecification Management
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  k% P$ K, c8 i8 WStandards (Communication, Sensor Bus…)
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! q; h; f1 E% g3 B, xTool Productivity Data Collection/Analysis
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Please consider the following important dates:
% z% Q' \) g- q: K; G2 H            Deadline of abstract submission : July 1, 2008
; c1 e7 N( r0 E  ~% n            Notification of accetpance : August 22, 2008
. ?- K  o# U9 A7 c) U$ k            Final paper due : October 20, 2008
            Deadline of early registration : October 20, 2008
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% V6 T$ L0 \' C6 XIf any question, please contact with Celia Shih  石英堂
Taiwan Semiconductor Industry Association
台灣半導體產業協會
Tel : +886-3-5917092
Fax: +886-3-5820056