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發表於 2011-9-6 09:28:04
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Time | Title | 13:00 ~ 13:20 | ! s0 V) K: ?! A3 [( p
Registration
) ~9 ]" |1 \% _( b1 A6 _: H, ~報到 | 13:20 ~ 13:30 | 3 x, q7 {6 e3 P, l. I/ O1 E9 V) Q
Opening
, \( E$ }) z3 C( d( s5 K( m開場 | 13:30 ~ 14:00 |
8 K* X( v- P; O$ ?5 }* YPXI Interoperability
. @# E0 y8 q. d W7 LPXI 模組互通性之探究 | 14:00 ~ 14:50 | k, C6 D7 c+ F5 X- e
Fundamentals of High-Speed Digitizers
( R6 F$ X, `( j2 F1 b0 ?高速數位轉換器理論基礎與應用 | 14:50 ~ 15:10 | 6 p9 B7 h5 L/ p
Tea Break
% T' M! p+ V" H5 j中場休息 | 15:10 ~ 15:40 |
! u) i4 S1 y W# p4 SFundamentals of High-Speed data Throughput in PXI
: B9 z* \4 h) P2 M% f- BPXI 系統高速資料傳輸之剖析 | 15:40 ~ 16:30 | - [; Q& f" E/ v; k( x
Electronic functional test best practices - Methods to achieve accurate, reliable measurements in electronic functional test applications2 m, U8 l& s- Y' S# i5 H8 V
電子功能性測試最佳實務:實現準確、可靠的電子功能性測試應用 |
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