9/16 2011 無線終端產品量測技術研討會

mister_liu

－無線終端產品測試:SAR、OTA、4G、HAC & EMI/ESD
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: C/ S; p' w# P% |# }% F為探討全球性通信資訊市場發展趨勢，使業界先進對電磁量測儀表(DASY, iSAR, OTA等)更廣泛瞭解，並熟悉相關配套量測工具之實際操作情形，及介紹新一代行動無線寬頻技術。耀豋科技秉持服務客戶精神，於2011年首度舉辦「無線終端產品量測技術研討會」，於會中分享CTIA最新法規與發展、SAR, HAC, LTE, NFC測量技術及最新測試功能，誠摯邀請您與我們共襄盛舉！
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主辦單位：Schmid & Partner Engineering AG, Aplustech AT4 wireless,  Auden Techno. Corp. 耀登科技股份有限公司   
【會議地點及時間】：       
Date： 16.September.2011 (Friday)
9 C( d9 h+ s2 H6 C) ]Time： 9:00 AM ~ 17:30 PM
Location：Grand Victoria Hotel- 168 Jing Ye 4th Rd, Taipei 104  TEL02)8502-0000  
Contact information: Auden Techno. Corp. Equipment Marketing Dept.
5 ]" i$ C; n# D  [       TEL: (03) 3631901 or E-mail Ins@auden.com.tw
       Ext: 134 Stella  E-mail: Stella.huang@auden.com.tw
活動費用: 全程免費(提供午餐餐盒、講義、茶點、水果)

mister_liu

Time	16. September. 2011 (Friday)-Taiwan		Speaker
9:00-9:30	Registration & Coffee
9:30-9:40	Opening		Daniel Chang
9:40-10:00	Topic SAR-1	Current status and future direction of SAR & HAC measurement standards: Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232	Dr. Mark Douglas
10:00-10:30	Topic SAR-2	The present SAR regulation & newest information in Japan	Dr. Nobuhiro Nakanishi
10:30-10:50	Coffee Break
10:50:11:20	Topic SAR-3	TAF Proficiency Test Requirement, take SAR for example.	Roger Sheng
11:20-11:40	Topic SAR-4	Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms	Prof. Niels Kuster
11:40-12:00	Topic SAR-5	New advances in fast, reliable SAR measurement techniques	Dr. Mark Douglas
12:00-12:20	Topic SAR-6	Obtaining high-precision dielectric material characterization of liquids and solids	Dr. Mark Douglas
12:20-13:30	Lunch & DAK Demo
13:30-13:45	Topic OTA-1	Current status and future direction of CTIA 3.1 & 3GPP	Prof. Niels Kuster
13:45-14:25	Topic OTA-2	PART I - CTIA OTA TEST SYSTEM 9 r. T. W, l8 M9 \# I  h. kPART II - APLUSTECH PRODUCT PART III - MIMO ANTENNA TEST	Kyung-ki Min
14:25-14:40	Topic OTA-3	Novel OTA Phantoms	Prof. Niels Kuster
14:40-15:10	Topic 4G-1	NFC Testing Challenges - E: O$ `, f; H$ T2 u7 _2 \3 Y- 6 e9 b8 [5 e- `- l& SNFC Technology Main Features & \% M1 {8 p6 ]& l+ e, R, L- 6 _& l& S; b) c7 x( G2 ONFC Testing Challenges 1 Q. u* G5 U2 ^0 b9 Q-   p/ ?8 `: t: NNFC Forum Compliance Activities 9 f; w3 u- [; ?! J0 l  Q" Y- : `! a4 T: Y& s/ {7 k, M$ }/ A# b+ \RIDER RFID HF Tester	Rafael Garcia Escobar
15:10-15:30	Coffee Break
15:30-16:00	Topic 4G-2	LTE R&D Testing - & `4 T) }) B/ P0 L1 x& `LTE Design Verification Testing - Needed functionalities for R&D Testing - LTE Mobile Application Usage Cases 8 J3 Q4 z0 Y4 p2 c8 o- 2 o( F% M3 X$ H& w  a9 L9 MLTE RF Design Validation Tester	Rafael Garcia Escobar
16:00-16:20	Topic 4G-3	SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems)	Prof. Niels Kuster
16:20-16:40	Topic HAC-1	Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment	Dr. Fin Bomholt
16:40-17:10	Topic EMI/ESD-1	Next generation of near-field probes and their applications in ESD, EMI, etc.	Prof. Niels Kuster
17:10-17:30	Q & A		Annie Yang
17: 30-17:40	Closing		Daniel Chang

※ 主辦單位保有更換講師及議題之權利