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我也来分享一些示波器的资料

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發表於 2008-9-12 11:12:34 | 只看該作者 回帖獎勵 |倒序瀏覽 |閱讀模式
测试高速串行设计$ v# S4 ^( x# t$ V8 @( o
SATA, t; g5 Z) l5 q; Z. n
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- {; ?" e4 v( ^/ vPCI Express
; m+ s* m, {6 X) i" SHDMI
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2#
 樓主| 發表於 2008-9-12 11:14:29 | 只看該作者

VoIP一致性、互操作能力和性能測試-Chris Kirk

VoIP一致性、互操作能力和性能測試-Chris Kirk# J  U8 H+ [# m6 G. l
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 樓主| 發表於 2008-9-12 11:18:59 | 只看該作者

ABCs of Probes

Table of Contents
. Y; V6 ^- q; S1 MProbes – The Critical Link To Measurement Quality . . . . . . . . .5
! x3 ]& i3 J! M! c/ r( d9 qWhat is a Probe? . . . . . .5
7 X3 t$ w# y# h) s- qThe Ideal Probe . . . . . . .65 U) t6 ]: L0 y: o
The Realities of Probes . 7+ D0 S; d# s1 T4 U; O) X5 ~
Choosing the Right Probe .105 \, h) t9 l! u9 z7 T" x3 O
Some Probing Tips . . . .113 m6 ~# S: [- y/ }: E
Summary 12
7 J: \0 A& C3 C* PDifferent Probes for Different Needs . . . . . . . . .13
! q, S' y/ h5 B, F' {3 L" R+ \Why So Many Probes? .13
8 k9 P0 s% C3 T! M) Z' sDifferent Probe Types and Their Benefits . . . . . . . .14" C) ~: ?( j: z- n5 w
Floating Measurements .19
- e1 o) ^- ~8 F  DProbe Accessories . . . .20
' R$ d& A) `) E, n- yHow Probes Affect Your Measurements . . . . . . 225 j1 G- D/ P/ L, D& ?
The Effect of Source Impedance . . . . .22
: x2 _8 Z; S% A. v$ \& S( QCapacitive Loading . . . .220 ]4 h, A, N. j* p: |
Bandwidth Considerations 24* ^# _/ F: ^9 e  K5 Y" w  t8 ?
What To Do About Probing Effects . . . .28, Q- F: o+ A$ Z$ L6 B; ^
Understanding Probe Specifications . . . . . . . .29$ H9 g- I- x) ~$ n
Aberrations (universal) . 29. z" ?9 G3 i: C6 S7 b8 F7 J( H
Amp-Second Product (current probes) .29. ]! o( d+ W: r! X  t# N( D2 {
Attenuation Factor (universal) . . . . . . .29* b# L$ j# Y5 _) h$ V7 v* [: Y
Accuracy (universal) . . .29
; C) x% ^8 u$ V) qBandwidth (universal) . .30! {5 a4 r# Z. O5 A
Capacitance (universal) .30
2 [. P  c* t- w: @9 T2 P, jCMRR (differential probes) . . . . . . . . .30) k% h% c3 h% t, R
CW Frequency Current Derating (current probes) . . .31
. ?3 P3 L: S9 I9 D* S3 MDecay Time Constant (current probes) .31
, R0 M1 y1 K0 y8 K& v/ TDirect Current (current probes) . . . . . .31( n4 n$ w( k: @
Insertion Impedance (current probes) . .318 u* v. y$ S  U, h
Input Capacitance (universal) . . . . . . . .31
8 c& M) j7 B$ y% _6 V# Q/ ~Input Resistance (universal) . . . . . . . . .31; a0 X! T6 Z0 ]/ b/ A+ ~" b
Maximum Input Current Rating (current probes) . . .31- H! i! F0 o' R% D- @' G1 q$ X3 L
Maximum Peak Pulse Current Rating (current probes) .312 a1 Q0 X/ ~. @% j5 I/ N8 l
Maximum Voltage Rating (universal) . . .31
% ^8 N4 N# e; \6 j& S% g9 J0 [8 w; ePropagation Delay (universal) . . . . . . .31
' j, C8 h% g5 t% j/ P% PRise Time (universal) . .31
) d. D7 U: ~3 U4 q- q$ f6 Y  DTangential Noise (active probes) . . . . .31
# K( d7 ?! u7 _, HTemperature Range (universal) . . . . . .31
& [- g- u) e9 Z5 n+ ]8 J9 xA Guide to Probe Selection . . . . . . .32/ n( F; {5 r* ?1 J9 E
Understanding the Signal Source . . . . .32& Y, l, |% p( T5 X
Oscilloscope Issues . . .34
% o% ?6 ?. p) [4 WSelecting the Right Probe 356 w2 I1 i( p5 v- {' E# I8 Q
Advanced Probing Techniques . . . .36
1 B, Q% E( \( U9 ^Ground Lead Issues . . .36
& ]" H5 i7 B" L9 k9 qDifferential Measurements . . . . . . . . .39. _" H# `, P2 Q& g
Small Signal Measurements . . . . . . . . 427 }3 i  Q+ ^5 f
Explanation of Safety Precautions .44
8 ~  X+ \5 j- D* lObserve All Terminal Ratings . . . . . . . 44- e; g" f  h7 _8 w
Use Proper Grounding Procedures . . . .44
5 U( w. ~# ^/ i# JConnect and Disconnect Probes Properly . . . . . . . .44
7 P% [7 L  l2 H4 u" ?$ K* ^Avoid Exposed Circuitry . .45
; T" D. F- ^5 D8 JAvoid RF Burns While Handling Probes .45
% M3 T$ G" r7 T* J$ RDo Not Operate Without Covers . . . . . .45
* e0 G. f6 ~6 r/ S9 yDo Not Operate in Wet/Damp Conditions . . . . . . . .45- m/ z/ J/ C3 M* m! T1 y
Do Not Operate in an Explosive Atmosphere . . . . . .45% L9 M3 d0 k0 E: ]9 n
Do Not Operate with Suspected Failures . . . . . . . . .45
9 W4 t4 `  Z) I* WKeep Probe Surfaces Clean and Dry . . .45
9 z6 g  ?- }# P2 q1 qDo Not Immerse Probes in Liquids . . . .45
: A! t+ H# w# mGlossary+ G, b* Y" q! I3 Z! s) S
* v: v  P8 J5 f% j
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 樓主| 發表於 2008-9-12 11:28:40 | 只看該作者

A Guide to Digital Television Systems and Measurements

ABCs of Probes          
! \0 q- C- r, b$ D5 |$ y# I1. Introduction ....1
, j  O5 X  x% R! D, v. q; X2. Digital Basics  ....3
) @" e% F3 }+ }  xComponent and Composite (analog).... 38 D* ?( I$ Z  `
Sampling and Quantizing .... 42 C" C/ x3 \0 }9 ?. t
Digital Video Standards.... 48 P& X$ E6 L( x$ b
Serial Digital Video .... 8
! [1 T, p" A8 V1 WRate Conversion – Format conversion ....10& v6 z  Z* J; V! v4 O" I
3. Digital Audio ......11
/ o) t8 b; f0 ?% W8 D2 l1 |AES/EBU Audio Data Format ....11
5 V5 r* y; y( F, f8 u# iEmbedded Audio....11
7 J2 s4 G6 W- m4. System Hardware and Issues .... 192 E$ c7 s2 |  U/ t+ g; ?" n
Cable Selection ....19
1 x% W# y. m# o" d) @7 ~& U( EConnectors ....19. I* ?0 B/ R8 O% D7 f& f2 y+ Q' {
Patch Panels ....19, \% b/ H4 u. e& |  t* q8 d7 g' p) t
Terminations and Loop-throughs ....19
1 q/ U) A9 N$ jDigital Audio Cable and Connector Types .... 20
' Q9 l7 x; Y# A* U, lSignal Distribution, Reclocking .... 202 o5 T$ y% q( W: j# v
System Timing ....20+ U) ^2 D" T+ T1 e* l
5. Monitoring and Measurements .... 23
( b3 g% a5 [6 [. Q' c& g6. Measuring the Serial Signal....25# l; d. J( S7 |5 p8 z. w8 I, |
Waveform Measurements .... 25
- w0 r( S/ |+ f- y: B8 s3 y: R8 `7 [& \Measuring Serial Digital Video Signal Timing ....263 t+ V. d* g" \1 I6 ^/ W
7. Definition and Detection of Errors .... 29
$ l- i+ D; m( r- T# k8 L  f/ ~Definition of Errors .... 29
. S& g) l3 s5 xQuantifying Errors ....30; I! @# V2 m- L& d2 }2 A" E
Nature of the Studio Digital Video Transmission Systems ....30
# q: f1 {" w+ S8 \6 `" x5 l6 j6 ^, @Measuring Bit Error Rates ....32
2 Y# Q! @& n8 Q8 X* j1 |An Error Measurement Method for Television....32
1 y. z' ~" ?* }System considerations• • • • • •• • •• • 33, W1 X5 L1 x/ L
8. Jitter Effects and Measurements • • • • • •• 35/ d! x, v9 [2 D
Jitter in Serial Digital Signals • • • • • • • • 35$ e. ~; w2 h3 A0 r. s! m( ?
Measuring Jitter • • • • • • • • • 37# Z2 c) B. ~1 ~9 C/ V. C5 Q
9. System Testing • • • • • • • 39& B/ |  k( M+ d& k# ^' J1 g2 B. t
Stress Testing • • • •  • • • • • • 39
' ^' h1 e" }( m/ x) U: \' ^% m/ RSDI Check Field • •  • • • • • 39
  M, I. E$ B" K2 W  J) h10. Bibliography• • • • • • • • • 42+ o; i5 G% B3 ?6 O
Articles and Books• • • • • • • 42
- T1 ~4 B- a/ K( UStandards • • • • • • • • • 43) g2 b, ~2 y- @2 u! K) w
11. Glossary • •• • •

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 樓主| 發表於 2008-9-12 11:31:28 | 只看該作者

MPEG-2 Decoder Design & Test

MPEG-2 Decoder Design & Test

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 樓主| 發表於 2008-9-12 11:33:24 | 只看該作者

A Guide to MPEG Fundamentals and Protocol Analysis

A Guide to MPEG Fundamentals and Protocol Analysis
5 v7 I7 D: J6 S# H(Including DVB and ATSC)

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 樓主| 發表於 2008-9-12 11:34:31 | 只看該作者

Jitter Analysis:

Jitter Analysis:
/ D  f/ B3 T, v, v+ B" HAccuracy' d3 Z* P% Q, E
Resolution
0 N. |" V  W) w  j1 `1 IJitter Noise Floor4 ?+ d3 H8 \! B# z1 P/ P  F& q
Delta Time Accuracy

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8#
 樓主| 發表於 2008-9-12 11:36:41 | 只看該作者

Resolving Jitter Issues in Your Designs

The Most Comprehensive, Convenient and Cost-Effective Answer to Resolving Jitter Issues in Your Designs

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9#
發表於 2008-12-15 12:52:20 | 只看該作者

回復 2# 的帖子

thanks for your share . great!!!!!!!!!!!!!!!!!!
10#
發表於 2009-5-3 20:54:36 | 只看該作者
感謝大大的分享阿7 @  ?; K- G# z
在公司用到
( W2 d  n  X3 ]* _. a. O. q: K0 U1 A所以趕緊來看看囉8 S. j& f, ^2 z( K( ^3 H
``~~~
11#
發表於 2009-8-9 11:12:15 | 只看該作者
測試儀器的使用也是一門大學問!!!  謝謝大大的分享!!!  感謝至極!!!
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