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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents
/ T) c( U1 m9 v) `# E5 A2 YProbes – The Critical Link To Measurement Quality . . . . . . . . .57 S$ y8 |+ J% n9 ]* o
What is a Probe? . . . . . .52 K+ Z" g3 ~! F" J1 b: [
The Ideal Probe . . . . . . .68 [: u; H9 e* u$ f: v
The Realities of Probes . 7
) {- @$ G5 {+ g7 |Choosing the Right Probe .10. I, R( p0 z' ^7 x
Some Probing Tips . . . .11
& M& I4 N( i1 D! z B6 n5 l& kSummary 12
: E- l; j2 @% i' X9 g/ b% MDifferent Probes for Different Needs . . . . . . . . .13
, L& G# Q7 v$ P9 t$ q! ?Why So Many Probes? .13
+ B2 j/ ^7 h0 k9 |Different Probe Types and Their Benefits . . . . . . . .14+ B8 a. ?9 Q; I2 Q" I# h
Floating Measurements .19
; W! w; N2 _/ w0 _Probe Accessories . . . .206 ?* t! o9 Z. x3 u$ n, w
How Probes Affect Your Measurements . . . . . . 22# O) ^" y v+ K$ G$ z
The Effect of Source Impedance . . . . .226 P5 x5 |9 |! W' s, z* B& e
Capacitive Loading . . . .22+ p7 g# `, B* R2 g: t5 x! [/ B4 R! o
Bandwidth Considerations 24
S D }! G& M& U6 rWhat To Do About Probing Effects . . . .28, N3 L! n4 H' x) r }
Understanding Probe Specifications . . . . . . . .29
9 [% Z/ @* l8 }& Z% \+ G' UAberrations (universal) . 292 a1 S/ k5 S$ ` k
Amp-Second Product (current probes) .29/ w! I* c- E$ L% j9 h6 s
Attenuation Factor (universal) . . . . . . .290 T$ m: I, P+ P) I! C. D7 n
Accuracy (universal) . . .29# ^' y* t. F0 F. C' {
Bandwidth (universal) . .30
, M- C- C9 R3 ], z& p! R+ {( r, d: S& r5 CCapacitance (universal) .30/ I t* m! I, z& M+ H" n8 `8 ]
CMRR (differential probes) . . . . . . . . .30+ a! \) O2 H' h4 W: S4 R
CW Frequency Current Derating (current probes) . . .315 P5 v# X+ v1 E' |
Decay Time Constant (current probes) .31
& j" s3 c8 G8 r8 b# oDirect Current (current probes) . . . . . .31
0 ]+ X) u' u* E1 U! ~Insertion Impedance (current probes) . .313 b# L6 \) B+ B
Input Capacitance (universal) . . . . . . . .31
7 }# X1 a* j) B5 g& X2 }Input Resistance (universal) . . . . . . . . .319 Y6 U0 t4 L: g. e6 H1 ^2 A' }0 ]
Maximum Input Current Rating (current probes) . . .31
) L5 [, B: b6 T! E0 hMaximum Peak Pulse Current Rating (current probes) .31
2 w$ x0 ]( ~; iMaximum Voltage Rating (universal) . . .31/ m% {# B+ x3 }3 _( z$ S. f
Propagation Delay (universal) . . . . . . .31
P8 U% t, f7 I# O a" [Rise Time (universal) . .317 I) c4 l, M0 G9 Z( w- Q- i
Tangential Noise (active probes) . . . . .31$ c4 B. q: K K; Z" C- t0 ^
Temperature Range (universal) . . . . . .31+ o$ G$ M9 @. j. C, t- }
A Guide to Probe Selection . . . . . . .32$ \$ } U! v$ b0 Z1 C
Understanding the Signal Source . . . . .32: ?. s' ?0 G( G) v1 c: D
Oscilloscope Issues . . .34
3 ]9 G' h2 U) ^) K# d; H$ @Selecting the Right Probe 35
$ R6 t/ W, q0 o- Y$ j( EAdvanced Probing Techniques . . . .36
9 o0 E; T8 m. tGround Lead Issues . . .36
. ^- |' B* ~+ a3 TDifferential Measurements . . . . . . . . .39
* K: p6 m; g! ySmall Signal Measurements . . . . . . . . 42$ \3 R6 n5 R K9 B7 m! f0 V
Explanation of Safety Precautions .44
; g6 Z6 X$ t3 H. C4 l: _Observe All Terminal Ratings . . . . . . . 44
. Q4 \% y- A) s% IUse Proper Grounding Procedures . . . .44
_# n9 b4 |( U1 \/ }Connect and Disconnect Probes Properly . . . . . . . .44
1 _( a: ]' Q$ y) _' \. c& e/ zAvoid Exposed Circuitry . .45
* Q- j: ]5 g7 f4 l1 v9 @2 _ M2 sAvoid RF Burns While Handling Probes .45
- I% T' l8 z PDo Not Operate Without Covers . . . . . .45
/ I/ j( w8 c/ w! [. O) L. g- |Do Not Operate in Wet/Damp Conditions . . . . . . . .45
& q5 Q c. k1 @* z& `$ K- NDo Not Operate in an Explosive Atmosphere . . . . . .45
, J# @) I0 {& Z BDo Not Operate with Suspected Failures . . . . . . . . .45
d" ?" G# e2 m6 a0 IKeep Probe Surfaces Clean and Dry . . .45, G# }' }& D$ s2 ]2 T5 {
Do Not Immerse Probes in Liquids . . . .45
! i2 Y0 a/ [3 J; }9 B: ?Glossary
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