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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents
. Y; V6 ^- q; S1 MProbes – The Critical Link To Measurement Quality . . . . . . . . .5
! x3 ]& i3 J! M! c/ r( d9 qWhat is a Probe? . . . . . .5
7 X3 t$ w# y# h) s- qThe Ideal Probe . . . . . . .65 U) t6 ]: L0 y: o
The Realities of Probes . 7+ D0 S; d# s1 T4 U; O) X5 ~
Choosing the Right Probe .105 \, h) t9 l! u9 z7 T" x3 O
Some Probing Tips . . . .113 m6 ~# S: [- y/ }: E
Summary 12
7 J: \0 A& C3 C* PDifferent Probes for Different Needs . . . . . . . . .13
! q, S' y/ h5 B, F' {3 L" R+ \Why So Many Probes? .13
8 k9 P0 s% C3 T! M) Z' sDifferent Probe Types and Their Benefits . . . . . . . .14" C) ~: ?( j: z- n5 w
Floating Measurements .19
- e1 o) ^- ~8 F DProbe Accessories . . . .20
' R$ d& A) `) E, n- yHow Probes Affect Your Measurements . . . . . . 225 j1 G- D/ P/ L, D& ?
The Effect of Source Impedance . . . . .22
: x2 _8 Z; S% A. v$ \& S( QCapacitive Loading . . . .220 ]4 h, A, N. j* p: |
Bandwidth Considerations 24* ^# _/ F: ^9 e K5 Y" w t8 ?
What To Do About Probing Effects . . . .28, Q- F: o+ A$ Z$ L6 B; ^
Understanding Probe Specifications . . . . . . . .29$ H9 g- I- x) ~$ n
Aberrations (universal) . 29. z" ?9 G3 i: C6 S7 b8 F7 J( H
Amp-Second Product (current probes) .29. ]! o( d+ W: r! X t# N( D2 {
Attenuation Factor (universal) . . . . . . .29* b# L$ j# Y5 _) h$ V7 v* [: Y
Accuracy (universal) . . .29
; C) x% ^8 u$ V) qBandwidth (universal) . .30! {5 a4 r# Z. O5 A
Capacitance (universal) .30
2 [. P c* t- w: @9 T2 P, jCMRR (differential probes) . . . . . . . . .30) k% h% c3 h% t, R
CW Frequency Current Derating (current probes) . . .31
. ?3 P3 L: S9 I9 D* S3 MDecay Time Constant (current probes) .31
, R0 M1 y1 K0 y8 K& v/ TDirect Current (current probes) . . . . . .31( n4 n$ w( k: @
Insertion Impedance (current probes) . .318 u* v. y$ S U, h
Input Capacitance (universal) . . . . . . . .31
8 c& M) j7 B$ y% _6 V# Q/ ~Input Resistance (universal) . . . . . . . . .31; a0 X! T6 Z0 ]/ b/ A+ ~" b
Maximum Input Current Rating (current probes) . . .31- H! i! F0 o' R% D- @' G1 q$ X3 L
Maximum Peak Pulse Current Rating (current probes) .312 a1 Q0 X/ ~. @% j5 I/ N8 l
Maximum Voltage Rating (universal) . . .31
% ^8 N4 N# e; \6 j& S% g9 J0 [8 w; ePropagation Delay (universal) . . . . . . .31
' j, C8 h% g5 t% j/ P% PRise Time (universal) . .31
) d. D7 U: ~3 U4 q- q$ f6 Y DTangential Noise (active probes) . . . . .31
# K( d7 ?! u7 _, HTemperature Range (universal) . . . . . .31
& [- g- u) e9 Z5 n+ ]8 J9 xA Guide to Probe Selection . . . . . . .32/ n( F; {5 r* ?1 J9 E
Understanding the Signal Source . . . . .32& Y, l, |% p( T5 X
Oscilloscope Issues . . .34
% o% ?6 ?. p) [4 WSelecting the Right Probe 356 w2 I1 i( p5 v- {' E# I8 Q
Advanced Probing Techniques . . . .36
1 B, Q% E( \( U9 ^Ground Lead Issues . . .36
& ]" H5 i7 B" L9 k9 qDifferential Measurements . . . . . . . . .39. _" H# `, P2 Q& g
Small Signal Measurements . . . . . . . . 427 }3 i Q+ ^5 f
Explanation of Safety Precautions .44
8 ~ X+ \5 j- D* lObserve All Terminal Ratings . . . . . . . 44- e; g" f h7 _8 w
Use Proper Grounding Procedures . . . .44
5 U( w. ~# ^/ i# JConnect and Disconnect Probes Properly . . . . . . . .44
7 P% [7 L l2 H4 u" ?$ K* ^Avoid Exposed Circuitry . .45
; T" D. F- ^5 D8 JAvoid RF Burns While Handling Probes .45
% M3 T$ G" r7 T* J$ RDo Not Operate Without Covers . . . . . .45
* e0 G. f6 ~6 r/ S9 yDo Not Operate in Wet/Damp Conditions . . . . . . . .45- m/ z/ J/ C3 M* m! T1 y
Do Not Operate in an Explosive Atmosphere . . . . . .45% L9 M3 d0 k0 E: ]9 n
Do Not Operate with Suspected Failures . . . . . . . . .45
9 W4 t4 ` Z) I* WKeep Probe Surfaces Clean and Dry . . .45
9 z6 g ?- }# P2 q1 qDo Not Immerse Probes in Liquids . . . .45
: A! t+ H# w# mGlossary+ G, b* Y" q! I3 Z! s) S
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