標題: DFTC + ATPG Flow 中 scan_en & test_mode 問題 [打印本頁] 作者: hgby2209 時間: 2008-10-8 07:53 PM 標題: DFTC + ATPG Flow 中 scan_en & test_mode 問題 請問 Scan_en 可與其他 function pin , share pin 腳嗎? ! O3 K0 M2 w- I8 B; t
Test_mode 我查到是可以 share pin 但scan_en 沒查到可以, 0 o1 ?2 a- B2 ^1 N! z& k! ^所以不知可否?作者: rogeryang 時間: 2008-10-9 10:57 AM
scan_en 不行與其他 function pin share pin 腳.作者: lee100 時間: 2008-10-21 10:25 AM
actually scan enable signal can be shared with function pin, user have to insert control logic ("AND" gate for example, one of AND gate input connected to original function pin, another AND gate input connected to scan test mode signal and output of AND gate connected to scan enable pin of scan flip-flop). User should aware that fault coverage of cloud logic may dropped.