0 Y: ~* r8 F8 uAs for why need to measure the IV curve, it is because this method is the fastest way to detect whether your IC is damaged by ESD stress or not(compare with ATE). but you should always use ATE to check your IC after ESD stress. X1 c/ c3 h3 ]
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Hope this help作者: shinyen0622 時間: 2015-4-25 07:08 PM
感謝長知識了…… 6 f$ @2 H. t4 Q% _之前有遇到打完ESD後元件老化, # Z' w2 I5 E2 k _1 G原來是已經被stress了