Time | 16. September. 2011 (Friday)-Taiwan | Speaker |
9:00-9:30 | Registration & Coffee |
9:30-9:40 | Opening | Daniel Chang |
9:40-10:00 | Topic SAR-1 | Current status and future direction of SAR & HAC measurement standards:
; L+ k- s" L! M/ I, A9 FSpecific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232 | Dr. Mark Douglas |
10:00-10:30 | Topic SAR-2 | The present SAR regulation & newest information in Japan | Dr. Nobuhiro Nakanishi |
10:30-10:50 | Coffee Break |
10:50:11:20 | Topic SAR-3 | TAF Proficiency Test Requirement, take SAR for example. | Roger Sheng |
11:20-11:40 | Topic SAR-4 | Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms | Prof. Niels Kuster |
11:40-12:00 | Topic SAR-5 | New advances in fast, reliable SAR measurement techniques | Dr. Mark Douglas |
12:00-12:20 | Topic SAR-6 | Obtaining high-precision dielectric material characterization of liquids and solids | Dr. Mark Douglas |
12:20-13:30 | Lunch & DAK Demo |
13:30-13:45 | Topic OTA-1 | Current status and future direction of CTIA 3.1 & 3GPP | Prof. Niels Kuster |
13:45-14:25 | Topic OTA-2 | PART I - CTIA OTA TEST SYSTEM
& ?8 e8 I! }2 d3 J# N1 I% J4 pPART II - APLUSTECH PRODUCT
. ~* d4 a4 u5 B9 {( ePART III - MIMO ANTENNA TEST | Kyung-ki Min |
14:25-14:40 | Topic OTA-3 | Novel OTA Phantoms | Prof. Niels Kuster |
14:40-15:10 | Topic 4G-1 | NFC Testing Challenges
^$ y* O8 c7 Q-
2 i. @" `/ O6 P5 G4 dNFC Technology Main Features. J- Z6 G, S* l! F+ H. e7 r
-$ V- m: v6 d3 Y
NFC Testing Challenges
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& }0 m/ ]) }+ Z0 w, DNFC Forum Compliance Activities" D# k( ?" {) y* e1 H7 R7 l) x9 i
-
2 P1 a3 e( C4 X( u2 i- iRIDER RFID HF Tester | Rafael Garcia Escobar |
15:10-15:30 | Coffee Break |
15:30-16:00 | Topic 4G-2 | LTE R&D Testing
6 D5 l0 E' q$ }-" T4 F9 }: r% T$ J6 ^$ _9 y
LTE Design Verification Testing
4 N2 T f& n& U% {8 X- ?3 A& i-
! V) H( |: m& [" a; Y! d/ ~Needed functionalities for R&D Testing0 N9 p3 v/ y8 ]; w+ m' |
-1 ~) k/ Z% f( s( a* _ }
LTE Mobile Application Usage Cases5 n$ E$ p! h$ q$ D1 e) s
-" e/ Z% ] P t% H* _" D
LTE RF Design Validation Tester | Rafael Garcia Escobar |
16:00-16:20 | Topic 4G-3 | SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems) | Prof. Niels Kuster |
16:20-16:40 | Topic HAC-1 | Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment | Dr. Fin Bomholt |
16:40-17:10 | Topic EMI/ESD-1 | Next generation of near-field probes and their applications in ESD, EMI, etc. | Prof. Niels Kuster |
17:10-17:30 | Q & A | Annie Yang |
17: 30-17:40 | Closing | Daniel Chang |
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