Time | Agenda | Speaker |
12:30-13:00 | Registration 來賓報到 | * m K& y* k0 o% Y, f5 S
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13:00-13:05 | Welcome and Opening 歡迎與開幕致詞 | Steve Hsu President, ACE Solution |
13:05-13:15 | Efficient MFG RF test in Embedded System 最佳化-嵌入式無線通訊產品測試 | Vernon Rogers Director of Worldwide Sales, LitePoint |
13:15-14:15 | Advanced Embedded Testing for Connectivity 多重通訊嵌入式測試 | Justin Lin /Senior Application Engineer, LitePoint Christian Olgaard /CTO, LitePoint |
14:15-14:45 | Advantage of Multi-DUT Testing in Production 多埠平行量產測試的優點 | John Lukez /Director of Product Marketing, LitePoint Dr. Christian Olgaard /CTO, LitePoint |
14:15-15:15 | Next Generation Cellular Testing | John Lukez Director of Product Marketing, LitePoint |
15:15-16:15 | LitePoint Demo Auditorium -Improved WiFi test performance in production -Connectivity test in an embedded system -Multi-DUT connectivity test -Multi-DUT cellular test |
16:15-16:45 | LTE (MiMo) Technology and Application LTE技術發展與應用前景 | 國立交通大學資工系 許騰尹教授 Dr. Terng-Yin Hsu, Department of Computer Science; NCTU |
16:45-17:15 | Future of Wireless Connectivity 多功能無線產品量產測試的挑戰 | Dr. Christian Olgaard CTO, LitePoint |
17:15-17:30 | Q&A / Wrap up | ; F- O H; O) C2 i
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