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FLICKER NOISE IN CMOS LC OSCILLATORS国外硕士论文

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發表於 2009-10-10 21:11:46 | 只看該作者 回帖獎勵 |倒序瀏覽 |閱讀模式
A Thesis Presented to The Academic Faculty
5 P# ~) m% g. q' r# ABy Dale Scott Douglas In Partial Fulfillment Of the Requirements for the Degree
8 d: V$ N5 @5 o- I7 e6 hMaster of Science in Electrical and Computer Engineering( l) f# J# W! v9 c! R
Georgia Institute of Technology+ v5 S! T0 v, ]  d' H7 ^+ n  S
December, 2008- e( f5 u$ a: I& x

& c/ M& o% y$ S. s% x8 Q
6 Z  V( D9 z+ G. w$ k  U8 |+ KSUMMARY& |  U. g" \2 {
Sources of flicker noise generation in the cross-coupled negative resistance oscillator
5 s0 Q* c% k# J; Z(NMOS, PMOS, and CMOS) are explored. Also, prior and current work in the area of7 l$ T+ x+ r  v5 V
phase noise modeling is reviewed, including the work of Leeson, Hajimiri, Hegazi, and
& a; w/ n5 l8 z& Eothers, seeking the mechanisms by which flicker noise is upconverted.; p5 l' Q- h6 v0 F2 M% ]( B
A Figure of Merit (FOM) methodology suitable to the 1/f3 phase noise region is also
6 }+ s* y$ x- Y7 r" @developed, which allows a new quantity, FOM1, to be defined. FOM1 is proportional to
5 Q& K: t% }- p7 jflicker noise upconverted, thus allowing the effectiveness of flicker noise upconversion, w* L8 b1 H% O
suppression techniques to be evaluated, despite possibly changing bias points or tank Q,
0 K3 O" g9 p% G2 s$ \+ K! }which would change phase noise and FOM in the 1/f2 region.; g, f( p8 W3 f& l8 ?
The work of Hajimiri is extended with a simple ΛDC estimator for the special case of
' N" S- Y2 i5 h4 Q& QLC CMOS oscillators. A method of adaptive control of an oscillator core is presented, as
- R- a) c3 v1 U& M3 |well, comprised of a CMOS oscillator with a digitally adjustable N and P width, and a
' o. _4 b* s/ n1 E6 ]$ Kcircuit (which is essentially a tracking ADC) which repeatedly adjusts the relative N to P+ Y% R  R1 ^3 ?- M1 Q
width dependent on the ΛDC estimate to maintain the condition of minimum flicker noise% Y; T% N' U, t6 n
upconversion. A fixed calibration constant is sufficient to allow convergence to within
' ~& I1 o# w. A  e5 j/ a2 y0.7dB of optimal FOM1 for all cases of N width, for a varactorless oscillator test cell.- `, h2 `2 I, d7 C
Finally, a circuit is proposed which would allow the flicker noise reduction technique
- J% Y  }# A1 Q, T& m% Dof cycling to accumulation to be applied to continuous time oscillators, but is not5 M( Q, [  X  Z5 e
rigorously vetted.
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