Time | 16. September. 2011 (Friday)-Taiwan | Speaker |
9:00-9:30 | Registration & Coffee |
9:30-9:40 | Opening | Daniel Chang |
9:40-10:00 | Topic SAR-1 | Current status and future direction of SAR & HAC measurement standards:
# Y% Y. x# a' c# E& d t! \ SSpecific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232 | Dr. Mark Douglas |
10:00-10:30 | Topic SAR-2 | The present SAR regulation & newest information in Japan | Dr. Nobuhiro Nakanishi |
10:30-10:50 | Coffee Break |
10:50:11:20 | Topic SAR-3 | TAF Proficiency Test Requirement, take SAR for example. | Roger Sheng |
11:20-11:40 | Topic SAR-4 | Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms | Prof. Niels Kuster |
11:40-12:00 | Topic SAR-5 | New advances in fast, reliable SAR measurement techniques | Dr. Mark Douglas |
12:00-12:20 | Topic SAR-6 | Obtaining high-precision dielectric material characterization of liquids and solids | Dr. Mark Douglas |
12:20-13:30 | Lunch & DAK Demo |
13:30-13:45 | Topic OTA-1 | Current status and future direction of CTIA 3.1 & 3GPP | Prof. Niels Kuster |
13:45-14:25 | Topic OTA-2 | PART I - CTIA OTA TEST SYSTEM9 n( J1 y2 M; L7 T% D
PART II - APLUSTECH PRODUCT" s- `8 \% F9 d# A/ @' e5 @1 ~; r# E
PART III - MIMO ANTENNA TEST | Kyung-ki Min |
14:25-14:40 | Topic OTA-3 | Novel OTA Phantoms | Prof. Niels Kuster |
14:40-15:10 | Topic 4G-1 | NFC Testing Challenges5 p, l' }5 q4 J0 ?0 z1 i
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# z6 b. t0 r8 g7 rNFC Technology Main Features
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' b. Y" H( w g; d; N" xNFC Testing Challenges
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NFC Forum Compliance Activities# x2 a2 C+ {) R9 w
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RIDER RFID HF Tester | Rafael Garcia Escobar |
15:10-15:30 | Coffee Break |
15:30-16:00 | Topic 4G-2 | LTE R&D Testing2 I- n& _% Y7 s+ O! L# j& {/ D
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1 P {) {" A, D( H8 S: d' y% tLTE Design Verification Testing
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& z9 K/ q- G" L/ T0 }! N- A$ G' D) tNeeded functionalities for R&D Testing% i, f, @) S; S( v
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: _% n8 w/ g. _) ]9 @LTE Mobile Application Usage Cases6 X+ `% B; s# c; W2 m& I& I+ X$ M
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# X; n. C7 [; t4 R/ OLTE RF Design Validation Tester | Rafael Garcia Escobar |
16:00-16:20 | Topic 4G-3 | SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems) | Prof. Niels Kuster |
16:20-16:40 | Topic HAC-1 | Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment | Dr. Fin Bomholt |
16:40-17:10 | Topic EMI/ESD-1 | Next generation of near-field probes and their applications in ESD, EMI, etc. | Prof. Niels Kuster |
17:10-17:30 | Q & A | Annie Yang |
17: 30-17:40 | Closing | Daniel Chang |