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Design for Manufacturability and Yield for Nano-Scale CMOS (Series on Integrated Circuits and Systems) (Hardcover)by Charles Chiang (Author), Jamil Kawa (Author)
; x/ o4 s% A h! \+ QKey Phrases: open critical area, final thickness range, defect size distribution function, Model Based Dummy Filling, Improving Critical Area, Practical Application (more...) 4 p$ [* Q3 [6 s6 @
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(1 customer review) + s8 ]6 S8 K8 V( m6 m% @1 B h& \
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