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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents
# |! Q: A3 E) V# d* Y$ [Probes – The Critical Link To Measurement Quality . . . . . . . . .5! G0 J$ v0 V, k/ j' H0 {( C. C, c
What is a Probe? . . . . . .5
* _2 d4 |% P+ J, V/ VThe Ideal Probe . . . . . . .6
4 _: Z* N. a/ D' t$ L1 i+ F) W* WThe Realities of Probes . 7
$ j( h" ^+ R [- o( OChoosing the Right Probe .10
: a& b8 t% W6 r, `# p9 e1 BSome Probing Tips . . . .11
: a; z& {: S# m: DSummary 129 y) K6 g( K% Q
Different Probes for Different Needs . . . . . . . . .13
; P# E5 a2 q6 f4 v1 G' u+ h4 mWhy So Many Probes? .13, r5 A) H J/ b$ U
Different Probe Types and Their Benefits . . . . . . . .14
0 p5 ^3 E: c+ k0 zFloating Measurements .19
2 N) v' E$ o* l% f/ b5 y& n, rProbe Accessories . . . .20
& `$ ?6 t2 u9 Q" o9 xHow Probes Affect Your Measurements . . . . . . 22& O! `; M B. g
The Effect of Source Impedance . . . . .22
3 H8 O& i$ F- u4 qCapacitive Loading . . . .22
) Y0 @- X9 v; s' z8 Q2 XBandwidth Considerations 249 ~/ F: V, b& Y3 {, U
What To Do About Probing Effects . . . .28
1 w) P6 b/ j6 T. Y! L9 y- tUnderstanding Probe Specifications . . . . . . . .29# G1 l, w! a3 s4 }7 w+ W% ~
Aberrations (universal) . 29
* H6 h( F2 O7 uAmp-Second Product (current probes) .292 ?5 f& X! z* K+ \/ u5 D
Attenuation Factor (universal) . . . . . . .29
% `" E3 u- P0 ~Accuracy (universal) . . .291 {3 l+ a' A, k5 L0 t2 z; q
Bandwidth (universal) . .30
, I, p. i2 J6 XCapacitance (universal) .30$ ?% d( m, @2 n
CMRR (differential probes) . . . . . . . . .30
" l/ W/ v+ _4 [ QCW Frequency Current Derating (current probes) . . .31
9 a( s1 h( b' b9 B4 mDecay Time Constant (current probes) .31
2 ~9 ^1 V: n k& o$ B5 uDirect Current (current probes) . . . . . .31
/ V% w/ g' x8 \. z' k/ t1 aInsertion Impedance (current probes) . .31
0 R) B+ L/ a' |/ M& X. H2 QInput Capacitance (universal) . . . . . . . .31) E) f) w3 O! h1 ^2 f
Input Resistance (universal) . . . . . . . . .31
- d. s" n% o! g1 F% JMaximum Input Current Rating (current probes) . . .31
7 {& X6 l& Q' iMaximum Peak Pulse Current Rating (current probes) .319 L2 k# H+ g! _2 C( v5 b, {
Maximum Voltage Rating (universal) . . .31
, R9 c9 u1 f4 }+ C8 n. Q! \) GPropagation Delay (universal) . . . . . . .31( J x1 A3 Q6 {
Rise Time (universal) . .31
+ I. u k8 o7 H& n1 F6 q+ wTangential Noise (active probes) . . . . .312 C- a/ }, M* ~8 S5 t
Temperature Range (universal) . . . . . .31
5 f+ `/ W2 f; t0 H! V+ ]. z1 Q' oA Guide to Probe Selection . . . . . . .32
+ [1 b$ s1 [! A- s" X9 B/ ?7 pUnderstanding the Signal Source . . . . .32$ ~& T: j2 h( u; j! c
Oscilloscope Issues . . .347 k' S8 ~( g" R+ B+ O. o* D
Selecting the Right Probe 35' m" C z! y- J! z: F
Advanced Probing Techniques . . . .36
; z/ @9 E6 H' t( l9 }Ground Lead Issues . . .369 P" n5 `( j" e& X. {0 ]
Differential Measurements . . . . . . . . .39
" f) X/ b6 e$ U$ O" E* B; R4 uSmall Signal Measurements . . . . . . . . 42
- U" l# O: y8 @% I! p+ cExplanation of Safety Precautions .44
* M9 G& H( x" T; t. |. h% v! W8 ~Observe All Terminal Ratings . . . . . . . 44
9 w6 c. S% W. ~/ bUse Proper Grounding Procedures . . . .44) ~% k" x. D$ g; ]' T. A+ V, Z7 {
Connect and Disconnect Probes Properly . . . . . . . .44
7 I7 }$ H" N( m6 uAvoid Exposed Circuitry . .45 N$ G( S2 ?: h6 {. C. i
Avoid RF Burns While Handling Probes .45
9 B1 e& z& V9 Y" W' V# d$ K, \3 VDo Not Operate Without Covers . . . . . .45% r4 f% @) K# C; N
Do Not Operate in Wet/Damp Conditions . . . . . . . .450 F+ T# ~% N: P+ W7 ~
Do Not Operate in an Explosive Atmosphere . . . . . .45
2 u/ W3 W% S7 n) bDo Not Operate with Suspected Failures . . . . . . . . .450 n* E; m N- ]9 b: `: \3 K$ M
Keep Probe Surfaces Clean and Dry . . .45) k, V3 A4 S- j' f1 b$ L% P7 O: P" N6 g
Do Not Immerse Probes in Liquids . . . .45
- l5 [% v3 T' U ^& P5 SGlossary
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