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In order to save test device, usually will do Power to Ground then IO to Power/Ground and the last is Io to IO.
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The reason is:# T% J( l. o- T% {6 m
1. If power to ground can not pass, the rest combination has less chance to pass
& T3 \+ n" s F1 l! m3 m- d2. Usually power pin count is less than IO pin count. It is fast to get an idea how the chip's ESD level
! o2 z6 e! y- J3. If failed, it's easy to find the failed ESD zapping combination |
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