Time | 16. September. 2011 (Friday)-Taiwan | Speaker |
9:00-9:30 | Registration & Coffee |
9:30-9:40 | Opening | Daniel Chang |
9:40-10:00 | Topic SAR-1 | Current status and future direction of SAR & HAC measurement standards:$ B5 s2 o/ e/ w P1 }
Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232 | Dr. Mark Douglas |
10:00-10:30 | Topic SAR-2 | The present SAR regulation & newest information in Japan | Dr. Nobuhiro Nakanishi |
10:30-10:50 | Coffee Break |
10:50:11:20 | Topic SAR-3 | TAF Proficiency Test Requirement, take SAR for example. | Roger Sheng |
11:20-11:40 | Topic SAR-4 | Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms | Prof. Niels Kuster |
11:40-12:00 | Topic SAR-5 | New advances in fast, reliable SAR measurement techniques | Dr. Mark Douglas |
12:00-12:20 | Topic SAR-6 | Obtaining high-precision dielectric material characterization of liquids and solids | Dr. Mark Douglas |
12:20-13:30 | Lunch & DAK Demo |
13:30-13:45 | Topic OTA-1 | Current status and future direction of CTIA 3.1 & 3GPP | Prof. Niels Kuster |
13:45-14:25 | Topic OTA-2 | PART I - CTIA OTA TEST SYSTEM
% R0 y8 f5 n& i+ ^PART II - APLUSTECH PRODUCT0 x- `$ j5 Q) _/ k; ?6 N5 Z
PART III - MIMO ANTENNA TEST | Kyung-ki Min |
14:25-14:40 | Topic OTA-3 | Novel OTA Phantoms | Prof. Niels Kuster |
14:40-15:10 | Topic 4G-1 | NFC Testing Challenges
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7 W9 i4 H0 S. zNFC Technology Main Features
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NFC Testing Challenges. x' m+ C+ ?1 x0 D. q2 o3 x
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NFC Forum Compliance Activities
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1 }( ^0 G2 C. D! Z8 ~RIDER RFID HF Tester | Rafael Garcia Escobar |
15:10-15:30 | Coffee Break |
15:30-16:00 | Topic 4G-2 | LTE R&D Testing7 U7 c+ s, j' t$ x5 V/ j5 w
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LTE Design Verification Testing; _8 ~4 E2 c% b8 B
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Needed functionalities for R&D Testing
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LTE Mobile Application Usage Cases
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LTE RF Design Validation Tester | Rafael Garcia Escobar |
16:00-16:20 | Topic 4G-3 | SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems) | Prof. Niels Kuster |
16:20-16:40 | Topic HAC-1 | Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment | Dr. Fin Bomholt |
16:40-17:10 | Topic EMI/ESD-1 | Next generation of near-field probes and their applications in ESD, EMI, etc. | Prof. Niels Kuster |
17:10-17:30 | Q & A | Annie Yang |
17: 30-17:40 | Closing | Daniel Chang |