请教ESD测试顺序

scy8080

在ESD测试时，有三种测试组合：I/O对电源/地、I/O对I/O、电源对地，这几种组合有没有测试顺序？比如说先测试电源对地，再测试I/O对电源/地，最后是IO对I/O。

scy8080

用相對I-V漂移故障判断方法时，I-V曲线又是如何得到的？是将电源地接到一起来，然后对I/O加电压，得到电流对电压的曲线，还是将其他的I/O和电源/地接到一起哪？
; C, E0 b# b1 }对此比较困惑，望各位达人解惑，谢谢

daidai

Because all tests need to pass, so I think there is no fixed sequence. Normally, 电源对地 --> I/O对电源/地 --> I/O对I/O is recommended because this is general strength sequence of ESD immunity. For your reference.

daidai

用相對I-V漂移故障判断方法时，是将电源地接到一起来，然后对I/O加电压，得到电流对电压的曲线.

wesleysungisme

In order to save test device, usually will do Power to Ground then IO to Power/Ground and the last is Io to IO.
5 M0 f, F: S' U+ O/ H" H& o$ \6 X: ~
. a' J3 H2 k# m+ f7 ~% r8 FThe reason is:
1. If power to ground can not pass, the rest combination has less chance to pass
: a5 g7 O$ o, c7 c" l7 b) w2 N2. Usually power pin count is less than IO pin count. It is fast to get an idea how the chip's ESD level
) Z4 Z, G" {9 l% A3 h3 n# N; g3. If failed, it's easy to find the failed ESD zapping combination