Time | Title |
13:00 ~ 13:20 |
3 `: `0 s1 P% X! tRegistration
- C& | |8 D. ?5 c8 l報到 |
13:20 ~ 13:30 | , U# R" J2 `3 d5 v
Opening
6 i! x& n; K) \0 f& K開場 |
13:30 ~ 14:00 |
7 z( B3 i E( P* m, L9 m" |4 mPXI Interoperability
0 p+ K t3 s) GPXI 模組互通性之探究 |
14:00 ~ 14:50 |
: T" O/ G; Q- t' jFundamentals of High-Speed Digitizers
* L3 o' a/ Z. I/ Z. g& O: ^! p高速數位轉換器理論基礎與應用 |
14:50 ~ 15:10 | + S( R# E z; { _
Tea Break! `. N6 p0 q, M0 L3 G
中場休息 |
15:10 ~ 15:40 |
6 q4 q: d* ?0 x' B6 y8 yFundamentals of High-Speed data Throughput in PXI
( N0 A; N" j' d$ o6 G) h$ pPXI 系統高速資料傳輸之剖析 |
15:40 ~ 16:30 | 0 {2 M# l6 D8 ?$ K
Electronic functional test best practices - Methods to achieve accurate, reliable measurements in electronic functional test applications
; @. `" [6 o" r3 a P6 ?電子功能性測試最佳實務:實現準確、可靠的電子功能性測試應用 |