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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents
. i! Y( M; d, o) ^% WProbes – The Critical Link To Measurement Quality . . . . . . . . .5
4 A# x! d" E7 Z8 M7 w$ DWhat is a Probe? . . . . . .56 ~/ R: q: H7 k. l; } J
The Ideal Probe . . . . . . .63 e0 p; E$ k: c; T' a4 u
The Realities of Probes . 7! y0 P3 w+ i% N; ?/ P, i! @
Choosing the Right Probe .10
$ b# {7 b. I* Y0 m6 eSome Probing Tips . . . .113 G0 ~0 u# U9 {8 W4 u
Summary 121 o. Q1 B; x t
Different Probes for Different Needs . . . . . . . . .13
# p7 o; O0 n9 ]& g9 S# \1 S, ?7 fWhy So Many Probes? .13
/ W [0 o, C, cDifferent Probe Types and Their Benefits . . . . . . . .14
) g! x# i5 x. N7 A" y$ g: f* dFloating Measurements .19
# E. G: @1 |) l3 ]+ j( mProbe Accessories . . . .20/ ]7 e$ w7 f) k4 Y. n1 b
How Probes Affect Your Measurements . . . . . . 22
, `% \/ _5 R; X( E" X0 g5 JThe Effect of Source Impedance . . . . .22
, d0 j( P' \; ]5 j$ [; S" O9 H3 N7 tCapacitive Loading . . . .22 p- U9 u% }. g; k4 M" `( g& P- v+ ~
Bandwidth Considerations 24# f/ B+ h. P; @, K- N2 \% q4 _/ b
What To Do About Probing Effects . . . .28 ]" k) {1 G2 ]1 |8 P) x2 C
Understanding Probe Specifications . . . . . . . .29
) Z1 o1 P1 x: V6 g2 o& wAberrations (universal) . 29
& F/ J: f7 \0 X5 _8 Y4 H) P5 C0 F1 [1 h% rAmp-Second Product (current probes) .29; {" e6 f5 k! s- I/ u# c' K. x9 `+ K
Attenuation Factor (universal) . . . . . . .29
; E' n9 }, w, TAccuracy (universal) . . .29
+ H( x- n, h1 h% Q+ `Bandwidth (universal) . .30; o; P* r$ T/ j8 N3 d7 m
Capacitance (universal) .30
$ J+ X) w' @+ O0 C) z; }; v7 d" I; RCMRR (differential probes) . . . . . . . . .30
* @' S8 H! I; ]6 QCW Frequency Current Derating (current probes) . . .31$ V+ n, w' ^1 B4 ^" j9 N
Decay Time Constant (current probes) .31
~ u* `2 v- NDirect Current (current probes) . . . . . .31
- c- q6 ]7 D6 E2 [, w4 hInsertion Impedance (current probes) . .31
T0 ^6 h4 _) A2 b8 z2 A. zInput Capacitance (universal) . . . . . . . .311 |0 P1 p1 L- X# n4 t* I
Input Resistance (universal) . . . . . . . . .31
. ]1 v+ j4 ~$ a" x, I1 _4 @Maximum Input Current Rating (current probes) . . .31
# ~/ D% F5 A& r; Q% a- uMaximum Peak Pulse Current Rating (current probes) .31
( S' x8 c7 _8 v# C( ^! Q3 [* L6 oMaximum Voltage Rating (universal) . . .31
7 L2 q# P3 p5 a$ D2 y1 cPropagation Delay (universal) . . . . . . .31
4 @ e. r% V |/ u6 N: @! uRise Time (universal) . .31" \% R3 G; s6 k' z4 c
Tangential Noise (active probes) . . . . .31
/ Y4 {" T/ ]$ b) R3 S/ S0 DTemperature Range (universal) . . . . . .31
* s% C+ x; }' P. ]A Guide to Probe Selection . . . . . . .32
- b, s2 ]) i/ ~* n$ i% U5 iUnderstanding the Signal Source . . . . .32
) }* p( }/ p2 T5 NOscilloscope Issues . . .34# s' z2 E0 r9 V; N/ G. ]
Selecting the Right Probe 35* Y. N2 k* |* U/ R
Advanced Probing Techniques . . . .36 `' D, p; u2 T4 S" e$ `/ j
Ground Lead Issues . . .36
2 p, w* g$ I; ^: c1 nDifferential Measurements . . . . . . . . .39& S; ~8 M8 y9 q1 h
Small Signal Measurements . . . . . . . . 42
9 I5 c9 K( X7 |- x% A4 Z! ]Explanation of Safety Precautions .44
0 C. J3 A& ?0 T7 `0 ]% b, eObserve All Terminal Ratings . . . . . . . 44
+ h) |$ z H K% L) hUse Proper Grounding Procedures . . . .44. y- ^* F( I; w" e
Connect and Disconnect Probes Properly . . . . . . . .44
8 e c! q& p! S {/ PAvoid Exposed Circuitry . .45- c6 _+ ]5 R+ b" g' \
Avoid RF Burns While Handling Probes .45* ~+ m. z( s2 h* h$ t: Y; v
Do Not Operate Without Covers . . . . . .45
; V' A0 v- u A. Y$ mDo Not Operate in Wet/Damp Conditions . . . . . . . .45
1 Q. L! f Z" f+ T$ g3 _Do Not Operate in an Explosive Atmosphere . . . . . .45
8 a8 m: F& H" s$ B* r! O( DDo Not Operate with Suspected Failures . . . . . . . . .45
+ u2 x; P; F2 W( t9 TKeep Probe Surfaces Clean and Dry . . .45
3 E+ M1 R6 l% w& U; S$ \1 ^; Y `Do Not Immerse Probes in Liquids . . . .45
' {' R5 e( J% i6 {- }Glossary2 y' F; V6 [- X v$ a
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