9/15~16 安捷倫PXI/AXIe講座系列二-電子功能性測試與應用

tk02561

台灣安捷倫科技將於9月 15 和 16日分別在台北六福皇宮和新竹喜來登飯店，舉行【安捷倫電子功能性測試與應用講座】，為期兩天的活動，將協助工程師瞭解哪些新的

& V+ K7 e) y% E0 O+ @2 s" i9 ?! b測試技術可針對您的電子功能測試應用，進行準確、可靠且穩定一致的量測。此次講座將介紹PXI 模組互通性、各類型高速數位轉換器之應用、強化PXI 高速資

料傳輸效能，及電子功能測試最佳實作。透過量測基礎的技術分享，協助工程師克服未來電子測試系統整合之挑戰，利用功能強大的安捷倫模組化系列產品，達到電子功能測試系統最佳化。
. ~. J) t' i) T5 n; j* s4 A0 ]- N+ `; W
: [2 `' X6 u9 J( F1 C活動報名請洽安捷倫免付費客服專線：0800-047-866或請上網報名。安捷倫活動網址：www.agilent.com.tw/find/events
+ r, ^+ i; C% w2 t0 O$ |
課程日期/地點及報名編碼

日期	時間	地點	Event Code
2011.09.15	13:00 ~ 16:30	台北六福皇宮 % _1 ~1 y8 X: ]( F- C9 I5 `" x台北市南京東路三段 133 號	11_EV_013943
2011.09.16	13:00 ~ 16:30	新竹 – 喜來登大飯店 梅桐百廳 302 新竹縣竹北市光明六路東一段 265 號	11_EV_013944

tk02561

! {, G4 c; W6 E3 n  P, G

Title
1	1 M1 Q: T0 t2 Z/ I) |% }& VPXI Interoperability - U) x# c- @: RThis presentation provides insight into installing and using PXI equipment from multiple vendors, including module recognition & available software and the interoperability between PXI test tools
2	Fundamentals of High-Speed Digitizers 6 u5 Y5 F6 e4 V9 `8 s# ]% L" `What is a digitizer and what are the similarities and differences compared to digital scopes? This presentation focuses on providing an overview of digitizer basics and insight into the different front ends and their applications
3	Fundamentals of High-Speed data Throughput in PXI This presentation provides a background of PXI and PXIe data communication protocols that form the foundation of its high speed data performance. The latest product implementations of these standards and techniques to further take advantage of these capabilities are examined, providing insight into how these technologies might be utilized to meet high speed data bandwidth needs.
4	3 j9 q; q# U" q& \, k2 s; {/ F# ZElectronic functional test best practices - Methods to achieve accurate, reliable measurements in electronic functional test applications This presentation covers best practices for electronic functional and design validation test to help the test engineer achieve accurate, reliable measurements. The test engineer will come away from this presentation with the basic understanding and building blocks needed for tackling their next eletrical test system challenge.

tk02561

Time	Title
13:00 ~ 13:20	Registration 報到
13:20 ~ 13:30	V! u- j  i) ]( O1 ?4 P) t3 `Opening 開場
13:30 ~ 14:00	~6 c) K* T7 H: MPXI Interoperability " M! C6 {: d6 G8 vPXI 模組互通性之探究
14:00 ~ 14:50	Fundamentals of High-Speed Digitizers 高速數位轉換器理論基礎與應用
14:50 ~ 15:10	5 {. K4 o9 j$ ~$ O% P6 iTea Break * [3 K3 `$ @9 `  D中場休息
15:10 ~ 15:40	Fundamentals of High-Speed data Throughput in PXI PXI 系統高速資料傳輸之剖析
15:40 ~ 16:30	Electronic functional test best practices - Methods to achieve accurate, reliable measurements in electronic functional test applications 電子功能性測試最佳實務：實現準確、可靠的電子功能性測試應用