Chip123 科技應用創新平台

標題: High-Speed Serial Data Test Major Challenge？ [打印本頁]

---

作者: jiming    時間: 2008-9-22 06:07 PM
標題: High-Speed Serial Data Test Major Challenge？
Interfaces have moved from parallel to high-speed serial implementations!
6 Y) I- I5 U6 Q) Y8 Y. _Implications for Test & Measurement?

---

歡迎光臨 Chip123 科技應用創新平台 (http://chip123.com/)

Powered by Discuz! X3.2