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標題: 我也来分享一些示波器的资料 [打印本頁]
作者: vili    時間: 2008-9-12 11:12 AM
標題: 我也来分享一些示波器的资料
测试高速串行设计
  K6 k) M3 Q. T7 u2 e0 `, ASATA
8 q5 m/ |1 z* GFBDIMM
" J7 s) a6 w) k' bPCI Express
# T0 @1 ]' N5 r" OHDMI3 B+ T/ o+ Q: |3 k& ]
6 g, y/ J# ]1 J/ B5 B4 w" J
作者: vili    時間: 2008-9-12 11:14 AM
標題: VoIP一致性、互操作能力和性能測試-Chris Kirk
VoIP一致性、互操作能力和性能測試-Chris Kirk' S% o) c* S& W) N
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作者: vili    時間: 2008-9-12 11:18 AM
標題: ABCs of Probes
Table of Contents5 S5 v5 K6 t! C
Probes – The Critical Link To Measurement Quality . . . . . . . . .53 R2 L1 ^9 D7 J2 G" ^* J
What is a Probe? . . . . . .5
$ F# l6 @9 v$ Q/ h( AThe Ideal Probe . . . . . . .6
% _- u4 ~) s$ U- GThe Realities of Probes . 7% [; A$ B8 O+ e
Choosing the Right Probe .100 r9 F* ~5 o# _' C/ j
Some Probing Tips . . . .11
) N: H5 m" i+ }( E* Y, gSummary 12
$ S% S! h& Z2 g* kDifferent Probes for Different Needs . . . . . . . . .13
. G+ O8 Y' ^" YWhy So Many Probes? .13
' e2 ~2 c7 k4 K1 xDifferent Probe Types and Their Benefits . . . . . . . .141 e, W+ F6 U5 G- b) e8 u
Floating Measurements .19
& ]3 s* x1 s3 _3 T2 Q8 |1 DProbe Accessories . . . .208 C. Z/ n& V* v6 `
How Probes Affect Your Measurements . . . . . . 22) _! k3 _( i6 j& m2 ^
The Effect of Source Impedance . . . . .22
1 n- ^' ]- S) e6 X9 S0 JCapacitive Loading . . . .22
" [4 s4 U% D+ f2 J  Z+ s; KBandwidth Considerations 24
! {" ^+ Z0 s! d( W+ O2 YWhat To Do About Probing Effects . . . .28
" N3 |& c( e4 d. |Understanding Probe Specifications . . . . . . . .29
# u! t2 s. E: z9 B8 ~Aberrations (universal) . 293 R" @, N& ^; \( J' }
Amp-Second Product (current probes) .29, Z+ v) Z' t9 t7 _% @
Attenuation Factor (universal) . . . . . . .298 c( [. P8 ^8 s: m. \6 {
Accuracy (universal) . . .297 L7 Y/ }* i4 l
Bandwidth (universal) . .30
" T/ n5 S2 U, O# w* o8 p0 KCapacitance (universal) .30: s( W, s- Q# b! ~
CMRR (differential probes) . . . . . . . . .30/ W  f" F. \( C/ Q% s/ M
CW Frequency Current Derating (current probes) . . .31. Y1 i$ L7 a! X
Decay Time Constant (current probes) .31
# ?* A( R& @* {6 N- gDirect Current (current probes) . . . . . .31
% G) K" T, j7 t1 jInsertion Impedance (current probes) . .31
+ V+ B: g% {2 _+ O' t, q" @, ZInput Capacitance (universal) . . . . . . . .31
+ U$ t; }- M, H3 k  d2 a& PInput Resistance (universal) . . . . . . . . .31) r7 z% {- w/ ?/ r
Maximum Input Current Rating (current probes) . . .31
+ |. J0 {. n& v  r. _Maximum Peak Pulse Current Rating (current probes) .31/ b# G. h( |, z& c% A# w
Maximum Voltage Rating (universal) . . .316 c  y0 T) D! z" P# x8 f/ c# g
Propagation Delay (universal) . . . . . . .310 t' b2 \. W4 K9 @+ i3 k
Rise Time (universal) . .31* H0 L3 ?. R5 A5 X+ h
Tangential Noise (active probes) . . . . .31
( V9 K6 v1 i8 ]8 \# ?Temperature Range (universal) . . . . . .31
: i! k' E4 B7 U0 _- }A Guide to Probe Selection . . . . . . .32' ~, y* Q4 H% V0 s
Understanding the Signal Source . . . . .32
3 r! E8 F( [3 _2 X$ t) TOscilloscope Issues . . .34
! ^2 d* p. D' m1 R; Z$ e0 dSelecting the Right Probe 358 Q+ U# o. _; [# W+ C
Advanced Probing Techniques . . . .36. w1 O5 S' L4 }
Ground Lead Issues . . .36
! l8 S. G# y/ F7 n) HDifferential Measurements . . . . . . . . .39" k0 x" h8 X4 A. Y' I# f7 A
Small Signal Measurements . . . . . . . . 42
5 L; t5 l+ _7 ?6 p4 S& RExplanation of Safety Precautions .44
2 t3 h0 W/ e  J* Y# @. y- T4 EObserve All Terminal Ratings . . . . . . . 44! X6 l# c  Q7 s) T
Use Proper Grounding Procedures . . . .44
) a; ~& ^3 K. NConnect and Disconnect Probes Properly . . . . . . . .44
: B2 ]! p: G8 t+ ^  P) sAvoid Exposed Circuitry . .456 B) `' q/ ]1 W" h  ^
Avoid RF Burns While Handling Probes .45/ W" w$ @: c( v
Do Not Operate Without Covers . . . . . .456 M$ D1 u0 Z; \
Do Not Operate in Wet/Damp Conditions . . . . . . . .45! f4 E+ h, W" q4 Y6 s) B$ x2 O  l+ m
Do Not Operate in an Explosive Atmosphere . . . . . .45& b2 y4 b+ s" H8 Z" a9 v( w
Do Not Operate with Suspected Failures . . . . . . . . .45) J3 l3 q) s3 U; ]# F( e( y7 d% d
Keep Probe Surfaces Clean and Dry . . .45% s( p: G& s' X5 @/ j% V
Do Not Immerse Probes in Liquids . . . .45
+ T6 g7 q$ w1 D- v9 H9 d7 qGlossary: v6 a" u- o3 G# H2 f7 @

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作者: vili    時間: 2008-9-12 11:28 AM
標題: A Guide to Digital Television Systems and Measurements
ABCs of Probes          
# ~/ n) q) a3 y5 z# r9 w0 N0 e1 s1. Introduction ....1/ N6 C/ K0 j8 G7 q, `) c
2. Digital Basics  ....33 ]' G. a9 r7 x
Component and Composite (analog).... 3
% l' g8 O3 R+ i0 W4 b* ^* R; z& jSampling and Quantizing .... 4
6 w9 G/ _4 r' o5 F: w0 ODigital Video Standards.... 4! t6 p4 C: J- m8 g! B7 m+ y# [
Serial Digital Video .... 8: L- F( Q, z2 e1 ?/ [$ o4 [
Rate Conversion – Format conversion ....10
# v; O4 I# m7 @0 I9 {& A3. Digital Audio ......11
1 L0 B$ I1 S6 s6 l( [AES/EBU Audio Data Format ....11
0 F+ Y. R1 E$ b! W9 V% y3 _Embedded Audio....11
0 }, q7 R+ _7 C, F9 y4. System Hardware and Issues .... 19
$ j7 m( g6 o  tCable Selection ....19+ b9 ]/ [0 r8 Z9 S* G$ _4 u  m
Connectors ....196 K0 I8 I7 D3 r; h0 n. L
Patch Panels ....19
8 \8 c% Q4 @: C% Y. U1 N6 GTerminations and Loop-throughs ....195 I$ W4 S- x; k2 o. B4 Q
Digital Audio Cable and Connector Types .... 209 d% p2 [- ~& m  D
Signal Distribution, Reclocking .... 201 T4 b7 E8 m6 ]7 ?
System Timing ....20' A! Q( C% Q/ w$ S, B
5. Monitoring and Measurements .... 230 j4 P  s: j. B9 g0 }7 Y
6. Measuring the Serial Signal....25/ L  e$ B6 g. K' e4 C8 \; x
Waveform Measurements .... 255 }5 l' V# }: L! K  Z
Measuring Serial Digital Video Signal Timing ....26
: p8 F* c/ v8 {5 x; I) ~% D7. Definition and Detection of Errors .... 29
$ q3 p0 C9 g2 `5 M# V3 k% fDefinition of Errors .... 29
6 K2 C! m9 v. gQuantifying Errors ....301 A2 {& i  G& ^
Nature of the Studio Digital Video Transmission Systems ....30- @2 _+ s5 D6 Z( U
Measuring Bit Error Rates ....32) y# w" ]  k" u
An Error Measurement Method for Television....32/ \, [+ L# n, U4 M& G7 A/ b0 n
System considerations• • • • • •• • •• • 33
4 M/ d% n* `1 Q- V3 _* ^, Z, N8. Jitter Effects and Measurements • • • • • •• 35
, n8 f$ L& V8 G/ B' BJitter in Serial Digital Signals • • • • • • • • 35
4 @8 C. K; v# XMeasuring Jitter • • • • • • • • • 37' L& t7 R1 s& {, r5 F" x
9. System Testing • • • • • • • 39
4 e7 N) a( O$ m$ U9 |Stress Testing • • • •  • • • • • • 396 N4 H( [2 v3 B" W
SDI Check Field • •  • • • • • 39
8 Q7 c+ p7 W& B9 W! l) _+ \7 J10. Bibliography• • • • • • • • • 42" w$ {0 n  P* n; @; J" Y! L/ \
Articles and Books• • • • • • • 42
* ^, v) J! t8 G$ _Standards • • • • • • • • • 435 c: d( W# \& o! M
11. Glossary • •• • •
作者: vili    時間: 2008-9-12 11:31 AM
標題: MPEG-2 Decoder Design & Test
MPEG-2 Decoder Design & Test
作者: vili    時間: 2008-9-12 11:33 AM
標題: A Guide to MPEG Fundamentals and Protocol Analysis
A Guide to MPEG Fundamentals and Protocol Analysis
8 y* ~; B; J. r9 _* Z* L! h(Including DVB and ATSC)
作者: vili    時間: 2008-9-12 11:34 AM
標題: Jitter Analysis:
Jitter Analysis:% P' x" N- g& G( K; B
Accuracy3 B# q9 t) M! {0 Z4 Z: C$ F) x) [
Resolution; N# u: X! z2 b8 C- D! x3 h0 o
Jitter Noise Floor. @: F& h' Q: G2 \4 {
Delta Time Accuracy
作者: vili    時間: 2008-9-12 11:36 AM
標題: Resolving Jitter Issues in Your Designs
The Most Comprehensive, Convenient and Cost-Effective Answer to Resolving Jitter Issues in Your Designs
作者: PerformanceB    時間: 2008-12-15 12:52 PM
標題: 回復 2# 的帖子
thanks for your share . great!!!!!!!!!!!!!!!!!!
作者: bear_poppy    時間: 2009-5-3 08:54 PM
感謝大大的分享阿+ m2 R0 p( c! S6 |* k1 y
在公司用到
, [9 q( A! ?: e/ l- h' v/ R, i1 m# u所以趕緊來看看囉
- m+ y; Z# G, m% \& G7 J``~~~
作者: t69292000    時間: 2009-8-9 11:12 AM
測試儀器的使用也是一門大學問!!!  謝謝大大的分享!!!  感謝至極!!!



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