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標題: 9/16 2011 無線終端產品量測技術研討會 [打印本頁]
作者: mister_liu    時間: 2011-8-31 12:15 PM
標題: 9/16 2011 無線終端產品量測技術研討會
－無線終端產品測試:SAR、OTA、4G、HAC & EMI/ESD . N4 N3 l, f) v/ I1 _/ o8 j

! U, B# y9 P6 J8 @! \; @為探討全球性通信資訊市場發展趨勢，使業界先進對電磁量測儀表(DASY, iSAR, OTA等)更廣泛瞭解，並熟悉相關配套量測工具之實際操作情形，及介紹新一代行動無線寬頻技術。耀豋科技秉持服務客戶精神，於2011年首度舉辦「無線終端產品量測技術研討會」，於會中分享CTIA最新法規與發展、SAR, HAC, LTE, NFC測量技術及最新測試功能，誠摯邀請您與我們共襄盛舉！% D& a* M. K" U7 e8 f& R+ p7 V* T
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主辦單位：Schmid & Partner Engineering AG, Aplustech AT4 wireless,  Auden Techno. Corp. 耀登科技股份有限公司    ; [% d$ J* f! s4 y( T( H9 P
【會議地點及時間】：       
7 f4 m* J/ i* i3 l0 Q& Z9 cDate： 16.September.2011 (Friday)
: ^/ b7 W  [( k% _: e+ z" g: kTime： 9:00 AM ~ 17:30 PM
' H. K3 s; t0 F" N/ R; f' JLocation：Grand Victoria Hotel- 168 Jing Ye 4th Rd, Taipei 104  TEL02)8502-0000  
- u  Q, y7 Y; Z0 d4 v8 p7 iContact information: Auden Techno. Corp. Equipment Marketing Dept.
8 x8 @* q2 C9 {2 F       TEL: (03) 3631901 or E-mail Ins@auden.com.tw0 q, o  s( m5 S4 ^- j8 C. h( U6 O
       Ext: 134 Stella  E-mail: Stella.huang@auden.com.tw- d2 A( @' ^* K/ a
活動費用: 全程免費(提供午餐餐盒、講義、茶點、水果)
作者: mister_liu    時間: 2011-8-31 12:15 PM

Time

16. September. 2011 (Friday)-Taiwan

Speaker

9:00-9:30

Registration & Coffee

9:30-9:40

Opening

Daniel Chang

9:40-10:00

Topic SAR-1

Current status and future direction of SAR & HAC measurement standards:# Y( X: G9 m3 k1 c, q% f; l& [
Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232

Dr. Mark Douglas

10:00-10:30

Topic SAR-2

The present SAR regulation & newest information in Japan

Dr. Nobuhiro Nakanishi

10:30-10:50

Coffee Break　

10:50:11:20

Topic SAR-3

TAF Proficiency Test Requirement, take SAR for example.

Roger Sheng

11:20-11:40

Topic SAR-4

Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms

Prof. Niels Kuster

11:40-12:00

Topic SAR-5

New advances in fast, reliable SAR measurement techniques

Dr. Mark Douglas

12:00-12:20

Topic SAR-6

Obtaining high-precision dielectric material characterization of liquids and solids

Dr. Mark Douglas

12:20-13:30

Lunch & DAK Demo　

13:30-13:45

Topic OTA-1

Current status and future direction of CTIA 3.1 & 3GPP

Prof. Niels Kuster

13:45-14:25

Topic OTA-2

PART I - CTIA OTA TEST SYSTEM( c4 L' @" W+ M
PART II - APLUSTECH PRODUCT& k7 G& I( _, ]4 ~8 m
PART III - MIMO ANTENNA TEST

Kyung-ki Min

14:25-14:40

Topic OTA-3

Novel OTA Phantoms

Prof. Niels Kuster

14:40-15:10

Topic 4G-1

NFC Testing Challenges
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NFC Technology Main Features$ k, r6 Z: \1 q0 S9 J
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NFC Testing Challenges8 W4 m, c: k" y! W$ {6 P( J% ^: Y
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% o- e7 H1 }3 V! e( KNFC Forum Compliance Activities" X% b: M# N; {, O. M3 c
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RIDER RFID HF Tester

Rafael Garcia Escobar

15:10-15:30

Coffee Break　

15:30-16:00

Topic 4G-2

LTE R&D Testing; o5 u+ F/ P+ r8 {7 i1 N, X+ T9 J( i
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  y9 h: {7 }0 n0 E0 F4 R  [3 H* pLTE Design Verification Testing, B0 L2 `" J( ^  w' m& U2 k
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Needed functionalities for R&D Testing$ s& a/ c9 e  C0 V* U! k" A4 x: D2 S
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( \) Q4 _- B2 u: kLTE Mobile Application Usage Cases
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( L; ]/ q: u4 V4 ?LTE RF Design Validation Tester

Rafael Garcia Escobar

16:00-16:20

Topic 4G-3

SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems)

Prof. Niels Kuster

16:20-16:40

Topic HAC-1

Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment

Dr. Fin Bomholt

16:40-17:10

Topic EMI/ESD-1

Next generation of near-field probes and their applications in ESD, EMI, etc.

Prof. Niels Kuster

17:10-17:30

Q & A

Annie Yang

17: 30-17:40

Closing

Daniel Chang

※ 主辦單位保有更換講師及議題之權利



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