標題: NFC HW test是否有conductive test? [打印本頁] 作者: no2892215 時間: 2011-5-9 10:04 PM 標題: NFC HW test是否有conductive test? NFC HW test是否有conductive test to assure HW performance?, S. o# C! `& |7 p, ]+ p
Any test instrument to introduce? 0 J4 ~0 {& r( GThanks作者: rohde 時間: 2011-8-29 09:18 PM
COMPRION is the only test equipment provider offering GCF and PTCRB validated SWP/HCI conformance test cases 6 Y. ^, L: _0 B0 h( m/ k' YPaderborn, April 2011 * v+ A* l. o) |COMPRION's SWP and HCI test cases running on the conformance test system ‘UT³ Platform' are now validated by GCF. Thus, the UT³ Platform is the only system available offering SWP/HCI terminal tests validated by GCF and PTCRB. 7 N" Q, U3 G+ {" i5 _! m* u 0 r B. z0 o i- N * J, _8 S2 m. ]4 I) o' X, K0 f- N% ^# Y
GCF has issued a Work Item (WI-133) to verify SWP and HCI functionality in mobile handsets. The process of introducing SWP/HCI tests into the GCF certification scheme has been finalised making the test cases available for validation. WI-133 covers test cases specified by ETSI TC SCP WG TEST in TS 102 694-1 (SWP) and TS 102 695-1 (HCI). Q, v4 z2 |. z: u& I7 B# j2 X- r) {1 c
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0 I6 O" N7 Q" G% T3 y# X8 PWith the validation of the first SWP/HCI test cases by GCF and PTCRB the building blocks for secure NFC applications such as payment have been laid. "We would like to contribute our part to ensuring interoperable NFC services." says Andreas Bertling, Chairman of ETSI TC SCP WG TEST and Product Manager at COMPRION.